Structural distortions in few-layer graphene creases

ACS Nano

Volumn 5, Issue 12, 2011, Pages 9984-9991

  Robertson, Alex W ^a   Bachmatiuk, Alicja ^b   Wu, Yimin A ^a   Schäffel, Franziska ^a   Büchner, Bernd ^b   Rümmeli, Mark H ^b,c   Warner, Jamie H ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b IFW DRESDEN   (Germany)

^c DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

APCVD; chemical vapor deposition; grapheme; HRTEM; TEM

Indexed keywords

2D FAST FOURIER TRANSFORMS; APCVD; CHEMICAL VAPOR; CRYSTAL STACKING; ELECTRONIC DEVICE; GRAPHEME; HRTEM; MULTI SLICES; OUT-OF-PLANE DISTORTIONS; REAL-SPACE; STACKING ORDER; STRUCTURAL DISTORTIONS; THERMAL EXPANSION COEFFICIENTS;

CATALYSTS; CRYSTAL STRUCTURE; ELECTRONIC PROPERTIES; FAST FOURIER TRANSFORMS; GRAPHENE; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; STACKING FAULTS; THERMAL EXPANSION; TRANSMISSION ELECTRON MICROSCOPY;

CHEMICAL VAPOR DEPOSITION;

GRAPHITE; NANOMATERIAL;

ARTICLE; CHEMICAL MODEL; CHEMICAL STRUCTURE; CHEMISTRY; COMPUTER SIMULATION; CONFORMATION; MACROMOLECULE; MATERIALS TESTING; PARTICLE SIZE; SURFACE PROPERTY; ULTRASTRUCTURE;

COMPUTER SIMULATION; GRAPHITE; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MODELS, CHEMICAL; MODELS, MOLECULAR; MOLECULAR CONFORMATION; NANOSTRUCTURES; PARTICLE SIZE; SURFACE PROPERTIES;

EID: 84555223585     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn203763r     Document Type: Article

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