Revealing the role of defects in ferroelectric switching with atomic resolution

Nature Communications

Volumn 2, Issue 1, 2011, Pages

  Gao, Peng ^a   Nelson, Christopher T ^a   Jokisaari, Jacob R ^a   Baek, Seung Hyub ^b   Bark, Chung Wung ^b   Zhang, Yi ^a,c   Wang, Enge ^d   Schlom, Darrell G ^e   Eom, Chang Beom ^b   Pan, Xiaoqing ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

^b University of Wisconsin Madison   (United States)

^c NANJING UNIVERSITY   (China)

^d PEKING UNIVERSITY   (China)

^e Cornell University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LEAD; NANOFILM; OZONE; TITANIUM; ZIRCONIUM; NANOMATERIAL; OXIDE;

ARTICLE; CHEMICAL REACTION; ELECTRIC FIELD; FERROELECTRIC SWITCHING; MOLECULAR MECHANICS; TRANSMISSION ELECTRON MICROSCOPY; CHEMISTRY; CRYSTALLIZATION; ELECTRICITY; ELECTRODE; ELECTRONICS; METHODOLOGY; NANOTECHNOLOGY; ULTRASTRUCTURE;

CRYSTALLIZATION; ELECTRICITY; ELECTRODES; ELECTRONICS; LEAD; MICROSCOPY, ELECTRON, TRANSMISSION; NANOSTRUCTURES; NANOTECHNOLOGY; OXIDES; TITANIUM; ZIRCONIUM;

EID: 84455208865     PISSN: None     EISSN: 20411723     Source Type: Journal    
DOI: 10.1038/ncomms1600     Document Type: Article

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