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Volumn 6, Issue 1, 2012, Pages 35-40

Self-terminating diffraction gates femtosecond X-ray nanocrystallography measurements

(68)  Barty, Anton a   Caleman, Carl a   Aquila, Andrew a   Timneanu, Nicusor b   Lomb, Lukas c,d   White, Thomas A a   Andreasson, Jakob b   Arnlund, David e   Bajt, Saša a   Barends, Thomas R M c,d   Barthelmess, Miriam a   Bogan, Michael J f   Bostedt, Christoph f   Bozek, John D f   Coffee, Ryan f   Coppola, Nicola a,p   Davidsson, Jan b   Deponte, Daniel P a   Doak, R Bruce g   Ekeberg, Tomas b   more..

a DESY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords


EID: 84355163051     PISSN: 17494885     EISSN: 17494893     Source Type: Journal    
DOI: 10.1038/nphoton.2011.297     Document Type: Article
Times cited : (306)

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