Scattering amplitudes and static atomic correction factors for the composition-sensitive 002 reflection in sphalerite ternary III-V and II-VI semiconductors

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 68, Issue 1, 2012, Pages 68-76

  Schowalter, M ^a   Muller K ^a   Rosenauer, A ^a  

^a UNIVERSITY OF BREMEN   (Germany)

Author keywords

correction factor; modified atomic scattering amplitudes; scattering factors; static atomic displacements

Indexed keywords

SULFIDE; ZINC DERIVATIVE; ZINC SULFIDE;

ARTICLE; CHEMISTRY; COMPUTER PROGRAM; QUANTUM THEORY; SEMICONDUCTOR; TRANSMISSION ELECTRON MICROSCOPY;

MICROSCOPY, ELECTRON, TRANSMISSION; QUANTUM THEORY; SEMICONDUCTORS; SOFTWARE; SULFIDES; ZINC COMPOUNDS;

EID: 84255167094     PISSN: 01087673     EISSN: 16005724     Source Type: Journal    
DOI: 10.1107/S0108767311037779     Document Type: Article

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