Modeling the compositional dependence of electron diffraction in dilute GaAs- and GaP-based compound semiconductors

Physical Review B - Condensed Matter and Materials Physics

Volumn 78, Issue 7, 2008, Pages

  Rubel, O ^a   Nemeth I ^a   Stolz, W ^a   Volz, K ^a  

^a PHILIPPS UNIVERSITY MARBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 50449106925     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.78.075207     Document Type: Article

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