Influence of surface preparation on scanning Kelvin probe microscopy and electron backscatter diffraction analysis of cross sections of CdTe/CdS solar cells

Materials Research Society Symposium Proceedings

Volumn 1324, Issue , 2012, Pages 57-62

  Moutinho, H R ^a   Dhere, R G ^a   Jiang, C S ^a   Al Jassim, M M ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CDS; CDTE; CDTE/CDS; CROSS SECTION; CRYSTALLOGRAPHIC STRUCTURE; DEPLETION REGION; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION ANALYSIS; GOOD DATA; HIGH SPATIAL RESOLUTION; INTERDIFFUSION LAYER; ION-BEAM MILLING; P-N JUNCTION; SAMPLE PREPARATION; SCANNING KELVIN PROBE MICROSCOPY; SURFACE PREPARATION;

BACKSCATTERING; CADMIUM COMPOUNDS; CADMIUM SULFIDE; CADMIUM SULFIDE SOLAR CELLS; CADMIUM TELLURIDE; ELECTRIC PROPERTIES; ELECTRON DIFFRACTION; ION BEAMS; MILLING (MACHINING); POLISHING; PROBES; SEMICONDUCTOR JUNCTIONS; SOLAR ENERGY; SUSTAINABLE DEVELOPMENT;

FILM PREPARATION;

EID: 84055193732     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/opl.2011.1057     Document Type: Conference Paper

References (6)

1. D. J. Dingley and D. P. Field, Mater. Sci. Technol. 13, 69 (1997).
2. P. A. Rosenthal and E. T. Yu, J. Appl. Phys. 87, 1937 (2000).
3. H. R. Moutinho, R. G. Dhere, M. J. Romero, C.-S. Jiang, B. To, and M. M. Al-Jassim, J. Vac. Sci. Technol. A 26, 1068 (2008).
4. Y. Yan and M. M. Al-Jassim, J. Appl. Phys. 90, 3952 (2001).
5. J. Quadros, A. L. Pinto, H. R. Moutinho, R. G. Dhere, and L. R. Cruz, J. Mater. Sci. 43, 573 (2008).
6. H. R. Moutinho, R. G. Dhere, C.-S. Jiang, Y. Yan, D. S. Albin, and M. M. Al-Jassim, J. Appl. Phys. 108, 074503 (2010).