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Volumn 131, Issue 3, 2012, Pages 600-604
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Low cost CuInSe 2 thin films production by stacked elemental layers process for large area fabrication of solar cell application
a
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Author keywords
Atomic force microscopy (AFM); I V characteristics; Stacked elemental layers (SEL); X ray diffraction (XRD)
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Indexed keywords
AFM IMAGE;
AIR AMBIENT;
AIR-ANNEALING;
ANNEALED FILMS;
AS-GROWN;
CHALCOPYRITE STRUCTURES;
CIS FILM;
CIS THIN FILMS;
ELECTRICAL MEASUREMENT;
GLASS SUBSTRATES;
I-V MEASUREMENTS;
IN-VACUUM;
IV CHARACTERISTICS;
LOW COSTS;
SOLAR-CELL APPLICATIONS;
STACKED ELEMENTAL LAYER;
STACKED LAYER;
X-RAY DIFFRACTION (XRD);
XRD PATTERNS;
AMORPHOUS FILMS;
AMORPHOUS MATERIALS;
ANNEALING;
ATOMIC FORCE MICROSCOPY;
COPPER;
COPPER COMPOUNDS;
CRYSTALLITE SIZE;
IODINE;
MOLYBDENUM;
SEMICONDUCTING SELENIUM COMPOUNDS;
SUBSTRATES;
VACUUM;
VANADIUM;
VAPOR DEPOSITION;
X RAY DIFFRACTION;
THIN FILMS;
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EID: 83555165871
PISSN: 02540584
EISSN: None
Source Type: Journal
DOI: 10.1016/j.matchemphys.2011.10.023 Document Type: Article |
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Times cited : (13)
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References (29)
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