Positron and X-ray diffraction study of Cu-Se, In-Se and CuInSe2 thin films

Materials Letters

Volumn 54, Issue 2-3, 2002, Pages 169-174

  Nancheva, N ^a   Docheva, P ^a   Djourelov, N ^b   Balcheva, M ^a  

^a UNIVERSITY OF RUSE   (Bulgaria)

^b INSTITUTE FOR NUCLEAR RESEARCH AND NUCLEAR ENERGY   (Bulgaria)

Author keywords

Annealing; CIS films; D.C. magnetron sputtering; Positron annihilation; X ray diffraction

Indexed keywords

ANNEALING; COPPER COMPOUNDS; CRYSTAL DEFECTS; CRYSTALLINE MATERIALS; INDIUM COMPOUNDS; MAGNETRON SPUTTERING; MORPHOLOGY; PHASE COMPOSITION; POSITRON ANNIHILATION SPECTROSCOPY; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

MONOVACANCY;

THIN FILMS;

EID: 0036570797     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-577X(01)00557-2     Document Type: Article

References (21)