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Volumn 99, Issue 23, 2011, Pages

Anomalously high thermoelectric power factor in epitaxial ScN thin films

Author keywords

[No Author keywords available]

Indexed keywords

ELASTIC RECOIL DETECTION ANALYSIS; ELECTRICAL RESISTIVITY; POWER FACTORS; REACTIVE MAGNETRON SPUTTERING; THERMOELECTRIC POWER FACTORS; THERMOELECTRIC PROPERTIES; TRACE AMOUNTS; TRANSITION METAL NITRIDES;

EID: 83455258026     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3665945     Document Type: Article
Times cited : (92)

References (21)
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  • 2
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  • 7
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    • Electronic structure of scandium nitride with nitrogen and scandium deficits
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  • 8
  • 10
    • 0036645241 scopus 로고    scopus 로고
    • Phase stability, nitrogen vacancies, growth mode, and surface structure of ScN(0 0 1) under Sc-rich conditions
    • DOI 10.1016/S0022-0248(02)01447-1, PII S0022024802014471
    • H. A. H. Al-Brithen, E. M. Trifan, D. C. Ingram, A. R. Smith, and D. Gall, J. Cryst. Growth 242, 345 (2002). 10.1016/S0022-0248(02)01447-1 (Pubitemid 34732221)
    • (2002) Journal of Crystal Growth , vol.242 , Issue.3-4 , pp. 345-354
    • Al-Brithen, H.A.H.1    Trifan, E.M.2    Ingram, D.C.3    Smith, A.R.4    Gall, D.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.