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Volumn 4, Issue 1, 2012, Pages 91-94
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Nanostructure of buried interface layers in TiO 2 anatase thin films grown on LaAlO 3 and SrTiO 3 substrates
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Author keywords
[No Author keywords available]
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Indexed keywords
BURIED INTERFACE;
CHEMICAL CHARACTERIZATION;
CRITICAL THICKNESS;
FILM/SUBSTRATE INTERFACE;
GROWTH MODES;
HIGH-ANGLE ANNULAR DARK FIELDS;
MICRO-STRUCTURAL;
OXIDE INTERFACES;
SRTIO;
TIO;
EPITAXIAL FILMS;
FILM GROWTH;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
LANTHANUM ALLOYS;
PULSED LASER DEPOSITION;
STRONTIUM ALLOYS;
STRONTIUM TITANATES;
SUBSTRATES;
TITANIUM DIOXIDE;
TRANSMISSION ELECTRON MICROSCOPY;
VAPOR DEPOSITION;
INTERFACES (MATERIALS);
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EID: 83455195431
PISSN: 20403364
EISSN: 20403372
Source Type: Journal
DOI: 10.1039/c1nr11015b Document Type: Article |
Times cited : (23)
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References (23)
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