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Volumn 4, Issue 1, 2012, Pages 91-94

Nanostructure of buried interface layers in TiO 2 anatase thin films grown on LaAlO 3 and SrTiO 3 substrates

Author keywords

[No Author keywords available]

Indexed keywords

BURIED INTERFACE; CHEMICAL CHARACTERIZATION; CRITICAL THICKNESS; FILM/SUBSTRATE INTERFACE; GROWTH MODES; HIGH-ANGLE ANNULAR DARK FIELDS; MICRO-STRUCTURAL; OXIDE INTERFACES; SRTIO; TIO;

EID: 83455195431     PISSN: 20403364     EISSN: 20403372     Source Type: Journal    
DOI: 10.1039/c1nr11015b     Document Type: Article
Times cited : (23)

References (23)
  • 13
    • 83455207102 scopus 로고    scopus 로고
    • ed. G. Salviati, T. Sekiguchi, S. Heun and A. Gustafsson, Research Signpost 37/661 (2) Fort O. Trivandrum-695 023, Kerala, India
    • E. Carlino, in Beam Injection Based Nanocharacterization of Advanced Materials, ed., G. Salviati, T. Sekiguchi, S. Heun, and, A. Gustafsson, Research Signpost 37/661 (2) Fort P.O. Trivandrum-695 023, Kerala, India, 2008, p. 237
    • (2008) Beam Injection Based Nanocharacterization of Advanced Materials , pp. 237
    • Carlino, E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.