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Volumn 7, Issue 10, 2004, Pages

Novel interpretations of CMP removal rate dependencies on slurry particle size and concentration

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CONDENSATION; HYDROTHERMAL SYNTHESIS; MATHEMATICAL MODELS; PARTICLE SIZE ANALYSIS; PRECIPITATION (CHEMICAL); REACTION KINETICS; SOL-GELS; THIN FILMS;

EID: 8344250968     PISSN: 10990062     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1795033     Document Type: Article
Times cited : (41)

References (12)
  • 9
    • 0000900695 scopus 로고    scopus 로고
    • R. Opila, I. Ali, Y. Arimoto, Y. Homma, C. Reidsema-Simpson, and K. Sundaram, Editors, The Electrochemical Society Proceedings Series, Pennington, NJ
    • U. Mahajan, S. Lee, and R. Singh, in Chemical Mechanical Planarization in IC Device Manufacturing III, R. Opila, I. Ali, Y. Arimoto, Y. Homma, C. Reidsema-Simpson, and K. Sundaram, Editors, PV 99-37, p. 396, The Electrochemical Society Proceedings Series, Pennington, NJ (1999).
    • (1999) Chemical Mechanical Planarization in IC Device Manufacturing III , vol.PV 99-37 , pp. 396
    • Mahajan, U.1    Lee, S.2    Singh, R.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.