Quantitative TEM analysis of quantum structures

Journal of Alloys and Compounds

Volumn 382, Issue 1-2, 2004, Pages 2-9

  Neumann, Wolfgang ^a   Kirmse, Holm ^a   Häusler, Ines ^a   Otto, Reinhard ^a   Hähnert, Irmela ^a  

^a HUMBOLDT UNIVERSITY   (Germany)

Author keywords

Crystal growth; Elasticity; Island; Nanostructure; Nanostructures; Quantum dot; Semiconductor; Solid solution; Strain; Transmission electron microscopy

Indexed keywords

ELASTICITY; HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGE ANALYSIS; LIQUID PHASE EPITAXY; METALLORGANIC CHEMICAL VAPOR DEPOSITION; NANOSTRUCTURED MATERIALS; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON; SOLID SOLUTIONS; STRAIN; TRANSMISSION ELECTRON MICROSCOPY;

CHEMICAL SENSITIVITY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY (HRTEM); NANOSTRUCTURES;

SEMICONDUCTOR QUANTUM DOTS;

EID: 8344226115     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2004.05.066     Document Type: Conference Paper

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