Retrieval of object information by inverse problems in electron diffraction

Journal of Microscopy

Volumn 190, Issue 1-2, 1998, Pages 238-248

  Scheerschmidt, K ^a  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

Electron crystallography; Electron holography; High resolution electron microscopy; Improperly posed problems; Inverse solutions; Object retrieval

Indexed keywords

CRYSTAL ORIENTATION; DIFFERENTIAL EQUATIONS; EIGENVALUES AND EIGENFUNCTIONS; ELECTRON HOLOGRAPHY; ELECTRON SCATTERING; ELECTRONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INVERSE PROBLEMS;

DIFFRACTION CONTRAST; DIRECT ANALYSIS; ELECTRON CRYSTALLOGRAPHY; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IMPROPERLY POSED PROBLEM; INVERSE SOLUTION; MATCHING TECHNIQUES; OBJECT INFORMATION; OBJECT RETRIEVAL; PHENOMENOLOGICAL ANALYSIS;

ELECTRON DIFFRACTION;

AMPLITUDE MODULATION; ELECTRON DIFFRACTION; HOLOGRAPHY; IMAGE ANALYSIS; INFORMATION RETRIEVAL; LIGHT SCATTERING; MATHEMATICAL COMPUTING; PRIORITY JOURNAL; REVIEW;

EID: 0031921530     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1998.2960853.x     Document Type: Review

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