-
1
-
-
0005908470
-
Radiation sensors
-
S. M. Sze, Ed. New York: Wiley
-
S. Audet and J. Steigerwald, "Radiation sensors," in Semiconductor Sensors, S. M. Sze, Ed. New York: Wiley, 1994, pp. 271-329.
-
(1994)
Semiconductor Sensors
, pp. 271-329
-
-
Audet, S.1
Steigerwald, J.2
-
2
-
-
0035794877
-
Cadmium zinc telluride and its use as a nuclear radiation detector material
-
Apr.
-
T. E. Schlesinger, J. E. Toney, H. Yoon, E. Y. Lee, B. A. Brunett, and L. Franks et al., "Cadmium zinc telluride and its use as a nuclear radiation detector material," Math. Sci. Eng. R, vol. 32, pp. 103-189, Apr. 2001.
-
(2001)
Math. Sci. Eng. R
, vol.32
, pp. 103-189
-
-
Schlesinger, T.E.1
Toney, J.E.2
Yoon, H.3
Lee, E.Y.4
Brunett, B.A.5
Franks, L.6
-
3
-
-
0031288433
-
Coplanar-grid detector with single-electrode readout
-
M. S. Amman and P. N. Luke, "Coplanar-grid detector with single-electrode readout," Proc. SPIE, vol. 3155, pp. 205-213, 1997.
-
(1997)
Proc. SPIE
, vol.3155
, pp. 205-213
-
-
Amman, M.S.1
Luke, P.N.2
-
4
-
-
1542269542
-
Various structures based on nickel oxide thick films as gamma radiation sensors
-
K. Arshak, O. Korostynska, and F. Fahim, "Various structures based on nickel oxide thick films as gamma radiation sensors," Sensors, vol. 3, pp. 176-186, 2003.
-
(2003)
Sensors
, vol.3
, pp. 176-186
-
-
Arshak, K.1
Korostynska, O.2
Fahim, F.3
-
5
-
-
0032140479
-
Radiation damage in scintillating crystals
-
Aug.
-
R. Y. Zhu, "Radiation damage in scintillating crystals," Nucl. Instrum. Meth. A, vol. 413, pp. 297-311, Aug. 1998.
-
(1998)
Nucl. Instrum. Meth. A
, vol.413
, pp. 297-311
-
-
Zhu, R.Y.1
-
6
-
-
3042820891
-
Gamma radiation-induced changes in the electrical and optical properties of tellurium dioxide thin films
-
Dec.
-
K. Arshak and O. Korostynska, "Gamma radiation-induced changes in the electrical and optical properties of tellurium dioxide thin films," IEEE Sensors J., vol. 3, pp. 717-721, Dec. 2003.
-
(2003)
IEEE Sensors J.
, vol.3
, pp. 717-721
-
-
Arshak, K.1
Korostynska, O.2
-
7
-
-
0035400306
-
5 - Si structures
-
July
-
5 - Si structures," Microelectr. J., vol. 32, pp. 553-562, July 2001.
-
(2001)
Microelectr. J.
, vol.32
, pp. 553-562
-
-
Atanassova, E.1
Paskaleva, A.2
Konakova, R.3
Spassov, D.4
Mitin, V.F.5
-
9
-
-
0033830248
-
Ab initio theory of point defects in oxide materials: Structure, properties, chemical reactivity
-
May
-
G. Pacchioni, "Ab initio theory of point defects in oxide materials: structure, properties, chemical reactivity," Solid State Sci., vol. 2, pp. 161-179, May 2000.
-
(2000)
Solid State Sci.
, vol.2
, pp. 161-179
-
-
Pacchioni, G.1
-
12
-
-
0036956324
-
Gamma radiation studies on optical materials
-
Dec.
-
E. Colby, G. Lum, T. Plettner, and J. Spencer, "Gamma radiation studies on optical materials," IEEE Trans. Nucl. Sci., vol. 49, pp. 2857-2867, Dec. 2002.
-
(2002)
IEEE Trans. Nucl. Sci.
, vol.49
, pp. 2857-2867
-
-
Colby, E.1
Lum, G.2
Plettner, T.3
Spencer, J.4
-
14
-
-
84961857465
-
Urbach rule
-
M. V. Kurik, "Urbach rule," Phys. Status Solidi, vol. A 8, pp. 9-45, 1971.
-
(1971)
Phys. Status Solidi
, vol.A 8
, pp. 9-45
-
-
Kurik, M.V.1
-
15
-
-
0041564558
-
Recent advances in compound semiconductor radiation detectors
-
Nov.
-
P. J. Sellin, "Recent advances in compound semiconductor radiation detectors," Nucl. Instrum. Meth. A, vol. 513, pp. 332-339, Nov. 2003.
-
(2003)
Nucl. Instrum. Meth. A
, vol.513
, pp. 332-339
-
-
Sellin, P.J.1
-
17
-
-
0037219067
-
x as gamma radiation sensors
-
x as gamma radiation sensors," Sensor Rev., vol. 23, pp. 48-54, 2003.
-
(2003)
Sensor Rev.
, vol.23
, pp. 48-54
-
-
-
18
-
-
0142157238
-
Radiation-induced changes in thin film structures
-
Aug.
-
_, "Radiation-induced changes in thin film structures," IEE P-Circ. Dev. Syst., vol. 150, pp. 361-366, Aug. 2003.
-
(2003)
IEE P-circ. Dev. Syst.
, vol.150
, pp. 361-366
-
-
-
19
-
-
84906702532
-
γ-radiation dosimetry using screen printed nickel oxide thick films
-
K. Arshak, O. Korostynska, and J. Harris, "γ-radiation dosimetry using screen printed nickel oxide thick films," in Proc. MIEL, 2002, pp. 357-360.
-
(2002)
Proc. MIEL
, pp. 357-360
-
-
Arshak, K.1
Korostynska, O.2
Harris, J.3
-
20
-
-
1542273637
-
Gamma radiation sensing properties of NiO thick film pn-junctions
-
O. Korostynska, K. Arshak, and M. Mahon, "Gamma radiation sensing properties of NiO thick film pn-junctions," in Proc. IEEE Sensors, 2003, pp. 79-83.
-
(2003)
Proc. IEEE Sensors
, pp. 79-83
-
-
Korostynska, O.1
Arshak, K.2
Mahon, M.3
-
22
-
-
0035445887
-
Theory of thermoluminescence gamma dose response: The unified interaction model
-
Sept.
-
Y. S. Horowitz, "Theory of thermoluminescence gamma dose response: the unified interaction model," Nucl. Instrum. Meth. B, vol. 184, pp. 68-84, Sept. 2001.
-
(2001)
Nucl. Instrum. Meth. B
, vol.184
, pp. 68-84
-
-
Horowitz, Y.S.1
-
23
-
-
8344260273
-
Single-crystal and solid-state molecular structures of phthalocyanine complexes
-
M. Engel, "Single-crystal and solid-state molecular structures of phthalocyanine complexes,", Tech. Rep. 11-54, 1996.
-
(1996)
Tech. Rep.
, pp. 11-54
-
-
Engel, M.1
-
24
-
-
0032023768
-
Determination of the thermal activation energy and optical band gap of cobalt phthalocyanine thin films
-
Mar.
-
S. Ambily and C. S. Menon, "Determination of the thermal activation energy and optical band gap of cobalt phthalocyanine thin films," Mater. Lett., vol. 34, pp. 124-127, Mar. 1998.
-
(1998)
Mater. Lett.
, vol.34
, pp. 124-127
-
-
Ambily, S.1
Menon, C.S.2
-
25
-
-
0030343479
-
Structure and electrical conduction properties of phthalocyanine thin films
-
Dec.
-
R. D. Gould, "Structure and electrical conduction properties of phthalocyanine thin films," Coordin. Chem. Rev., vol. 156, pp. 237-274, Dec. 1996.
-
(1996)
Coordin. Chem. Rev.
, vol.156
, pp. 237-274
-
-
Gould, R.D.1
-
26
-
-
84949229660
-
Effect of γ-radiation on the conduction mechanism of thermal vacuum deposited copper phthalocyanine thin films
-
A. Arshak, S. M. Zleetni, K. Arshak, and J. Harris, "Effect of γ-radiation on the conduction mechanism of thermal vacuum deposited copper phthalocyanine thin films," in Proc. IEEE-NANO, 2001, pp. 238-242.
-
(2001)
Proc. IEEE-NANO
, pp. 238-242
-
-
Arshak, A.1
Zleetni, S.M.2
Arshak, K.3
Harris, J.4
-
27
-
-
8344252387
-
Effect of γ-rays on the optical and electrical properties of copperphthalocyanine thick films
-
_, "Effect of γ-rays on the optical and electrical properties of copperphthalocyanine thick films," in Proc. MIEL, 2002, pp. 353-356.
-
(2002)
Proc. MIEL
, pp. 353-356
-
-
-
28
-
-
0038514396
-
γ-radiation sensor using optical and electrical properties of Manganese Phthalocyanine (MnPc) thick film
-
A. Arshak, S. M. Zleetni, and K. Arshak, "γ-radiation sensor using optical and electrical properties of Manganese Phthalocyanine (MnPc) thick film," Sensors, vol. 2, pp. 174-184, 2002.
-
(2002)
Sensors
, vol.2
, pp. 174-184
-
-
Arshak, A.1
Zleetni, S.M.2
Arshak, K.3
-
29
-
-
0029064065
-
3 layers in p-type silicon
-
May
-
3 layers in p-type silicon," Appl. Radiat. Isotopes, vol. 46, pp. 355-361, May 1995.
-
(1995)
Appl. Radiat. Isotopes
, vol.46
, pp. 355-361
-
-
Soliman, F.A.S.1
Al Kabbani, A.S.S.2
Sharshar, K.A.A.3
Rageh, M.S.I.4
|