Effect of doping and high-temperature annealing on the structural and electrical properties of Zn1-X NiXO(0≤X≤0.15) powders

Journal of Materials Science and Technology

Volumn 27, Issue 10, 2011, Pages 944-950

  Çolak, Hakan ^a   Türkoĝlu, Orhan ^a  

^a ERCIYES UNIVERSITY   (Turkey)

Author keywords

Four point probe method; II VI semiconductors; Zinc oxide and doped zinc oxide

Indexed keywords

AIR ATMOSPHERE; BINARY SYSTEMS; DC METHODS; EFFECT OF DOPING; ELECTRICAL CONDUCTIVITY; FOUR-POINT PROBE METHOD; FOUR-PROBE; HIGH-TEMPERATURE ANNEALING; I-PHASE; II-VI SEMICONDUCTOR; IMPURITY PHASE; MIXED PHASE; NI-DOPED; NI-DOPING; PURE ZNO; SCANNING ELECTRON MICROSCOPE; SINGLE PHASE; SOLUBILITY LIMITS; STRUCTURAL AND ELECTRICAL PROPERTIES; WURTZITES; XRD; ZNO; ZNO POWDER;

CRYSTAL IMPURITIES; CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY; POWDERS; PROBES; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR DOPING; SYSTEMS (METALLURGICAL); X RAY DIFFRACTION; ZINC; ZINC SULFIDE;

ZINC OXIDE;

EID: 82955211374     PISSN: 10050302     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1005-0302(11)60168-0     Document Type: Article

References (31)

1. Chu S.Y., Yan T.M., Chen S.L. Ceram. Int. 2000, 26(7):733.
2. Shinde V.R., Gujar T.R, Lokhande C.D., Mane R.S., Han S.H. Mater. Chem. Phys. 2006, 96(2):326.
3. Pearton S.J., Norton D.R., Ip K., Heo Y.W., Steiner T. Superlattice. Microst. 2003, 34(1-2):3.
4. Zhou Z., Kato K., Komaki T., Yoshino M., Yukawa H., Morinaga M., Morita K. J. Eur. Ceram. Soc. 2004, 24:139.
5. Pearton S.J., Norton DR., Ip K., Heo Y.W., Steiner T. J. Vac. Sci. Technol. B 2004, 22(3):932.
6. Wang L., Pu Y., Fang W., Dai J., Zheng C., Mo C., Xiong C. Thin Solid Films 2005, 491:323.
7. Singh S., Rama N., Rao M.S.R. Appl. Phys. Lett. 2006, 88:222111.
8. Ghosh S., Srivastava P., Pandey B., Saurav M., Bharadwaj P., Avasthi D.K., Kabiraj D., Shivaprasad S.M. Appl. Phys. A 2008, 90:765.
9. Pavle V.R., Daniel R.G. Phys. Rev. Lett. 2003, 91:157201-157202.
10. Yin Z., Chen N., Yang F., Song S., Chai C., Zhong J., Qian H., Ibrahim K. Solid State Commun. 2005, 135:430.
11. Wang X.B., Song C., Li D.M., Geng K.W., Zeng F., Pan F. Appl. Surf. Sci. 2006, 253:1639.
12. Shimono D., Tanaka S., Torikai T., Watari T., Murano M. J. Ceram. Proc. Res. 2001, 2(4):184.
13. Mao X., Zhong W., Du Y. J. Magn. Mater. 2008, 320:1102.
14. Jin Z., Murakami M., Fukumura T., Matsumoto Y., Ohtomo A., Kawasaki M., Koinuma H. J. Cryst. Growth 2000, 214-215:55.
15. Bhat S.V., Deepak F.L. Solid State Commun. 2005, 135:345.
16. Thota S., Dutta T., Kumar J. J. Phys. Condene. Matter. 2006, 18:2473.
17. özgür ü., Alivov Y.I., Liu C., Teke A., Reshchikov M.A., Dogn S., Avrutin V., Cho S.J., Morkoc H. J. Appl. Phys. 2005, 98:041301.
18. Weast R.C. Handbook of Chemistry and Physics 1975-1976, CRC Press, Cleveland. 56th edn.
19. Zhang Y., Wu L., Li H., Xu J., Han L., Wang B., Tuo Z., Xie E. J. Alloy. Compd. 2009, 473(1-2):319.
20. Pei G., Xia C., Cao S., Zhang J., Wu F., Xu J. J. Magn. Magn. Mater. 2006, 302:340.
21. Wei X.X., Song C., Geng K.W., Zeng F., He B., Pan F. J. Phys. Condens. Matter. 2006, 18:7471.
22. Yilmaz S., Turkoglu O., Belenli I. Mater. Chem. Phys. 2008, 112:472.
23. Girtan M., Rusu G.G., Seignon S.D., Rusu M. Appl. Surf Sci. 2008, 254(13):4179.
24. Sawalha A., Abu-Abdeen M., Sedky A. Physica B: Condensed Matter. 2009, 404:1316.
25. Han J., Senos A.M.R., Mantas P.Q. J. Eur. Ceram. Soc. 2002, 22:49.
26. Hossain M.S., Islam R., Khan K.A. Chalcogenide Lett. 2008, 5:1.
27. Katayama H., Sato K. Physica B 2003, 327:337.
28. Nunes P., Fortunato E., Vilarinho P., Martins R. Vacuum 2002, 64:281.
29. Natsume Y., Sakata H. Thin Solid Films 2000, 372:30.
30. Kumar R., Khare N. Thin Solid Films 2008, 516(6):1302.
31. Mehra R.M., Mathur P.C., Kathuria A.K., Shyam R. Phys. Status Solidi A 1977, 41(2):189.