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Volumn 110, Issue 10, 2011, Pages

Conducting nanofilaments formed by oxygen vacancy migration in Ti/TiO 2/TiN/MgO memristive device

Author keywords

[No Author keywords available]

Indexed keywords

BISTABLES; HIGH QUALITY; ION MIGRATION; MEMORY CELL; MGO(1 0 0); NANOFILAMENTS; OXYGEN VACANCY MIGRATION; RESISTIVE SWITCHING; RESISTIVE SWITCHING BEHAVIORS; RESISTIVE SWITCHING MECHANISMS; SINGLE PHASE; TIO; X-RAY DIFFRACTION STUDIES;

EID: 82555165217     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3662922     Document Type: Conference Paper
Times cited : (19)

References (23)
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    • (2008) Materials Today , vol.11 , Issue.6 , pp. 28-36
    • Sawa, A.1
  • 5
    • 34147108217 scopus 로고    scopus 로고
    • Evidence for an oxygen diffusion model for the electric pulse induced resistance change effect in transition-metal oxides
    • DOI 10.1103/PhysRevLett.98.146403
    • Y. B. Nian, J. Strozier, N. J. Xu, X. Chen, and A. Ignatiev, Phys. Rev. Lett. 98, 46403 (2007). 10.1103/PhysRevLett.98.146403 (Pubitemid 46557459)
    • (2007) Physical Review Letters , vol.98 , Issue.14 , pp. 146403
    • Nian, Y.B.1    Strozier, J.2    Wu, N.J.3    Chen, X.4    Ignatiev, A.5
  • 7
    • 79956011470 scopus 로고    scopus 로고
    • Organic electrical bistable devices and rewritable memory cells
    • DOI 10.1063/1.1473234
    • L. P. Ma, J. Liu, and Y. Yang, Appl. Phys. Lett. 80, 2997 (2002). 10.1063/1.1473234 (Pubitemid 34599224)
    • (2002) Applied Physics Letters , vol.80 , Issue.16 , pp. 2997
    • Ma, L.P.1    Liu, J.2    Yang, Y.3
  • 13
    • 34848820848 scopus 로고    scopus 로고
    • Microspectroscopic detection of local conducting areas generated by electric-pulse-induced phase transition in v O2 films
    • DOI 10.1063/1.2790830
    • J. S. Lee, M. Ortolani, U. Schade, Y. J. Chang, and T. W. Noh, Appl. Phys. Lett. 91, 133509 (2007). 10.1063/1.2790830 (Pubitemid 47502629)
    • (2007) Applied Physics Letters , vol.91 , Issue.13 , pp. 133509
    • Lee, J.S.1    Ortolani, M.2    Schade, U.3    Chang, Y.J.4    Noh, T.W.5
  • 15
    • 34147108217 scopus 로고    scopus 로고
    • Evidence for an oxygen diffusion model for the electric pulse induced resistance change effect in transition-metal oxides
    • DOI 10.1103/PhysRevLett.98.146403
    • Y. B. Nian, J. Strozier, N. J. Xu, X. Chen, and A. Ignatiev, Phys. Rev. Lett. 98, 146403 (2007). 10.1103/PhysRevLett.98.146403 (Pubitemid 46557459)
    • (2007) Physical Review Letters , vol.98 , Issue.14 , pp. 146403
    • Nian, Y.B.1    Strozier, J.2    Wu, N.J.3    Chen, X.4    Ignatiev, A.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.