EXELFS revisited

Micron

Volumn 27, Issue 6, 1996, Pages 449-466

  Sarikaya, M ^a   Qian, M ^a   Stern, E A ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

Author keywords

Al; Atomic structure; Carbonitride; EELS; EXELFS; Nanostructure; Nickel oxide; SiC; XAFS

Indexed keywords

EID: 0030422446     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(96)00044-3     Document Type: Review

References (61)

1. Angelini, P., Sklad, P. S., Sevely, J. C. and Husseis, D. K., 1988. Evaluation of amorphous and crystalline silicon carbide by Extended Energy Loss Fine Structure (EXELFS) Analysis. In: Proc. 46th Ann. Meeting of Electron Microsc. Soc. of Am. San Francisco Press, San Francisco, pp. 466-467.
2. Batson, P. E., 1994. Atomic resolution electronic structure using spatially resolved electron energy loss spectroscopy. Proc. of MRS Symp., Vol. 332, M. Sarikaya, M. Isaacson, and K. Wickramasinghe (eds). Materials Research Society, Pittsburgh. PA, pp. 275-286.
3. Bunker, G. B., 1984. An X-ray absorption study of transition metal oxides. Ph. D. dissertation, University of Washington.
4. Chen, M. Y., Lin, X., Dravid, V. P., Chung, Y. W., Wong, M. S. and Sproul, W. D., 1992. Growth and characterization of C-N thin films. Surg Coat. Tech., 54-55, 360-364.
5. Cohen, M. L., 1985. Calculation of bulk moduli of diamond and zinc-blende solids. Phys. Rev B, 32, 7988-7991.
6. Cosslett, V. E., 1978. Radiation damage in the high resolution electron microscopy of biological materials: a review. J. Microsc., 113, 113-129.
7. Csillag, S., Johnson, D. E. and Stern, E. A., 1981. Extended energy loss fine structure studies in an electron microscope. In: EXAFS Spectroscopy Techniques ami Applications. Teo, B. K. and Joy, D. C. (eds). Plenum. New York, pp. 241-254.
8. De Crescenzi, M., Lozzi, L., Picozzi, P. and Santucei, S., 1989. Structural determination of crystalline silicon by extended energy-loss fine-structure spectroscopy. Phys. Rev., 3912, 8409-8422.
9. Disko, M. M., Ahn, C. C., Meitzner, G. and Krivanek, O. L., 1988. Temperature dependence of aluminium EXELFS. In: Microbeam Anal. San Francisco Press. San Francisco, pp. 47-49.
10. Egerton, R. F., 1980. The use of electron lenses between a TEM specimen and an electron spectrometer. Optik, 56, 363-376.
11. Egerton, R. F., 1986. Electron Energy Loss Spectroscopy in the Electron Microscope. Plenum Press, New York, pp. 246-255.
12. Egerton, R. F. and Cheng, S. C., 1994. Characterization of an analytical electron microscope with a NiO test specimen. Ultrumicroscopy, 55, 43-54.
13. Fujimoto, F. and Ogata, K., 1993. Formation of carbon nitride films by means of ion assisted dynamic mixing (IVD) method. Jpn. J. Appl. Phys., 32, L420-423.
14. Glaeser, R. M., 1975. Radiation damage and biological electron microscopy. In: Physical Aspects of Electron Microscopy and Microbeam Analysis. B. M. Siegel and D. R. Beaman (eds). Wiley. New York, pp. 205-29.
15. Hussies, K., Zanchi, G., Sevely, J., Devaux, X. and Rousset, A., 1990. A comparative study of amorphous and crystalline alumina by EXELFS. In: Inst. Phys. Conf. .Ser., 98 EMAG-MICRO '89, Vol. 1, pp. 75-78.
16. Hug, G., Phan, C. L. and Slanche, G., 1995. Some unique aspects of transmission electron microscopy and sectrometry for present and future study of intermetallic compounds. Materials Science and Engineering A. A192-A193, 673-684.
17. Isaacson, M., 1977. Specimen damage in the electron microscope. In: Principles and Techniques of Electron Microscopy. M. A. Hayat (ed.). Van Nostrand, New York, Vol. 7, pp. 1-78.
18. Johnson, D. E., Csillag, S. and Stern, E. A., 1981. Analytical electron microscopy using extended energy loss fine structure (EXELFS). Scanning Electr. Microsc., 1, 105-115.
19. Kittel, C., 1986. Introduction to Solid State Physics, Wiley. New York.
20. Krishnan, K. M., 1990. Channeling and related effects in electron microscopy: the current status. Scanning Electron Microsc., Supplement, 4, 157-170.
21. Krivanek, O. L., Ahn, C C. and Keeney, R. B., 1987. Improved parallel-detection electron-energy-loss spectrometer. Ultramicroscopy, 22, 103-110.
22. Kundman, M., 1993. Instructions for EELS Acquisition. GATAN Inc., Pleasonton. CA. USA.
23. Leapman, R. D. and Cosslett, V. E., 1976. Extended fine structure above the X-ray edge in electron energy-loss spectra. J. Phys. D, 9 L, 29-32.
24. Leapman, R. D. and Silcox, J., 1979. Orientation dependence of core edges in electron-energy-loss spectra from anisotropic materials. Physical Review Letters, 42, 1361-1364.
25. Leapman, R. D. and Swyt, C. R., 1981. Electron energy-loss spectroscopy under conditions of plural scattering. In: Analytical Electron Microscopy - 1981, Geiss, R. H. (ed). San Francisco Press, San Francisco, pp. 164.
26. Leapman, R. D., Sun, S. Q. and Andrews, S. B. 1993. Use of EELS to assess beam damage in biological microanalysis, Microbeam Anal., 2 (suppl.). S258-9.
27. Liu, A. Y. and Cohen, M. L., 1989. Prediction of new low compressibility solids. Science, 245, 841-842.
28. Liu, A. Y. and Wentzkovitch, R. M., 1994. Stability of carbon nitride solids. Phys. Rev. B, 50, 10362-10365.
29. Martin, J. M. and Mansot, J. L., 1991. EXELFS analysis of amorphous and crystalline silicon carbide J. Microsc., 162(1), 171-178.
30. Martin-Gil, J., Martin-Gil, F. J., Morán, E., Miki-Yoshida, M., Martínez, L. and Yacamán, M., 1995. José Synthesis of low density and high hardness carbon spheres containing nitrogen and oxygen. Acta Met., 43, 1243-1247.
31. Maya, L., Cole, D. R. and Hagaman, W., 1991. Carbon nitrogen pyrolyzates: attempted preparation on carbon nitride. J. Amer. Ceram. Soc., 74, 1686-1688.
32. McMaster, W. H., Kerr Del Grande, N., Mallett, J. H. and Hubbell, J. H., 1969. Compilation of X-ray cross section. Lawrence Radiation Laboratory UCRI-50174 sec. II, p. 1.
33. Morton, D., Boyd, K. J., Al-Bayati, A. H., Todorov, S. S. and Rabalais, J. W., 1994. Carbon nitride deposited using energetic species: a two-phase system. Phys. Rev. Lett., 73, 118-121.
34. Mustre de Leon, J., Rehr, J. J., Zabinsky, S. I. and Albers, R. C., 1991. Ab initio curved-wave X-ray-absorption fine structure. Phys. Rev. B, 44, 4146-4156.
35. Newbury, D. and Leapman, R. D., 1994. Trace analysis of nanoscale materials by analytical electron microscopy. Proc. of MRS Symp., Vol. 332. M. Sarikaya, M. Isaacson, and K. Wickramasinghe (eds.). Materials Research Society, Pittsburgh. PA, 1994, pp. 287-292.
36. Newville, M., Livin, P., Yacoby, Y., Rehr, J. and Stern, E. A., 1993. Hera-edge X-ray-absorption fine structure of Pb: A comparison of theory and experiment. Phys. Rev B., 47, 14126-14131.
37. Niu, C., Lu, Y. Z. and Lieber, C. M., 1993. Experimental realization of the covalent solid carbon nitride. Science, 261, 334-336.
38. 4,5 edges. In: Microbeam Analysis, 1991. San Francisco Press, San Francisco, pp. 273-276.
39. Qian, M., Sarikaya, M. and Stern, E. A., 1993a. Acquisition of EELS spectra for high-resolution spectroscopy. In: Proceedings of the 51st Annual Meeting of Microscopy Society of America. San Francisco Press, San Francisco, pp. 578-579.
40. Qian, M., Sarikaya, M. and Stern, E. A., 1993b. EXELFS revisited: an improved data analysis technique. In: Proceedings of the 51st Annual Meeting of Microscopy Society of America. San Francisco Press, San Francisco, pp. 584-585.
41. Qian, M., Sarikaya, M. and Stern, E. A., 1995a. Development of the EXELFS technique for high accuracy structural information. Ultramicroscopy, 59, 137-147.
42. Qian, M., Sarikaya, M. and Stern, E. A., 1995b. Removing edge overlapping for maximum usage of EXELFS signal. In: Proceedings of the 53rd Annual Meeting of Microscopy Society of America. San Francisco Press, San Francisco, pp. 302-303.
43. Rehr, J. J., Albers, R. C., Zabinsky, S. I., 1992. High-order multiple-scattering calculations of X-ray absorption fine structure. Phys. Rev. Lett., 69, 3397-3400.
44. Rehr, J. J., Mustre de Leon, J., Zabinsky, S. I. and Albers, R. C., 1991. Theoretical X-ray absorption fine structure standards. J. Am. Chem. Soc., 113, 5135-5140.
45. Reimer, L., 1975. Review of radiation damage problem of organic specimens in electron microscopy. In: Physical Aspects of Electron Microscopy and Microbeam Analysis, B. M. Siegel and D. R. Beaman (eds). Wiley, New York, pp. 231-245.
46. 7-x, Phys. Rev. B., 37(16), 9373-9381.
47. 7-x. Physica C, 1522, 161-170.
48. Sarikaya, M. (ed.), 1992. Resolution in the Microscope, Ultramicroscopy, 47, 1306.
49. Sarikaya, M., Qian, M., Stern, E. A., 1995. Copyrighted UWEXELFS 1.0 software. Information regarding the UWEXELFS 1.0 may be obtained from M. Sarikaya, University of Washington.
50. Sayers, D. E., Stern, E. A. and Lytle, F. W., 1971. New technique for investigating noncrystalline structures: Fourier analysis of the extend X-ray-absorption fine structure. Phys. Rev. Lett., 27, 1204-1207.
51. Serin, V., Zanchi, G. and Sevely, J., 1992. EXELFS as a structural tool for studies of low z-elements. Microsc. Microanal. Microstruct., 3, 201-212.
52. Spence, J. C. H., 1980. The use of characteristic-loss energy selected electron diffraction patterns for site symmetry determination. Optik, 57, 451-456.
53. Spence, J. C. H. and Tafto, J., 1993. J. Microsc., 130, 147-154.
54. Stern, E. A., 1982. Comparison between electrons and X-rays for structure determination. Optik, 61, 45-51.
55. Stern, E. A. and Heald, W. M., 1983. Basic principles and applications of EXAFS. In: Handbook on Synchrotron Radiation., Vol. 1. Ch. 10. North Holland, Publisher, New York, pp. 955-1014.
56. Stern, E. A. et al., 1995. The copyrighted UWXAFS 3.0 software. Information regarding this software may be obtained from E. A. Stern, University of Washington.
57. Stern, E. A., Qian, M. and Sarikaya, M., 1994. Spatially Resolved Local Atomic Structure From EXELFS. Proc. of MRS Symp., Vol. 332. Sarikaya, M., Isaacson, M. and Wickramasinghe, K. (eds). Materials Research Society, Pittsburgh. PA, pp. 3-14.
58. Utlaut, M., 1981. A comparison of Electron and Photon Beams for Obtaining Inner Shell Spectra. EXAFS Spectroscope Techniques and Applications. B. K. Tao and D. C. Joy (eds). Plenum. New York, pp. 255-267.
59. Wyckoff, R. W. Crystal Structures. Interscience Publication. New York, NY, 1963.
60. 4. Phys. Rev. B., 49, 5034-5037.
61. Zeitler, E., 1979. Radiation damage in beam-sensitive materials. In: Developments in Electron Microscopy and Analysis 1979, H. J. Goringe (ed.). Inst. Phys. Conf. Ser. No. 61, I. O. P. Bristol, pp. 1-6.