Low-loss EELS study of oxide-covered aluminum nanospheres

Microscopy Microanalysis Microstructures

Volumn 8, Issue 2, 1997, Pages 145-155

  Stöckli, Thomas ^a   Stadelmann, Pierre ^a   Châtelain, André ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004855751     PISSN: 11542799     EISSN: None     Source Type: Journal    
DOI: 10.1051/mmm:1997113     Document Type: Article

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