Practical aspects of electron energy-loss spectroscopy (EELS) calculations using FEFF8

Micron

Volumn 38, Issue 1, 2007, Pages 1-11

  Moreno, M S ^a   Jorissen, K ^b   Rehr, J J ^b  

^a CENTRO ATÓMICO BARILOCHE   (Argentina)

^b UNIVERSITY OF WASHINGTON   (United States)

Author keywords

Ab initio calculations; EELS; ELNES; EXELFS; FEFF8; GaN; RSMS

Indexed keywords

AB INITIO CALCULATIONS; ELNES; EXELFS; LOCAL PROJECTED DENSITY OF STATES (LDOS);

COMPUTER SIMULATION; ELECTRONIC STRUCTURE; GALLIUM NITRIDE; IONIZATION; THERMAL EFFECTS;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 33750018630     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2006.03.011     Document Type: Review

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