Reduction of lift-off effects in pulsed eddy current for defect classification

IEEE Transactions on Magnetics

Volumn 47, Issue 12, 2011, Pages 4753-4760

  He, Yunze ^a,b   Pan, Mengchun ^a   Luo, Feilu ^a   Tian, Guiyun ^b  

^a NATIONAL UNIVERSITY OF DEFENSE TECHNOLOGY   (China)

^b NEWCASTLE UNIVERSITY   (United Kingdom)

Author keywords

Defect classification; feature extraction; frequency spectrum analysis; lift off; pulsed eddy current

Indexed keywords

ARTIFICIAL SURFACES; COMPLEX STRUCTURE; DEFECT CHARACTERIZATION; DEFECT CLASSIFICATION; DIFFERENTIAL SPECTRA; ELECTROMAGNETIC NONDESTRUCTIVE TESTING; EXPERIMENTAL STUDIES; FEATURE EXTRACTION TECHNIQUES; FREQUENCY DOMAINS; FREQUENCY SPECTRUM ANALYSIS; LIFT-OFF; LIFT-OFF EFFECT; PULSE EXCITATION; PULSED EDDY CURRENT; RESPONSE SIGNAL; RISING TIME; SINGLE-LAYER STRUCTURE; SUBSURFACE DEFECT; TIME DOMAIN; TIME TO PEAK; TWO-LAYER STRUCTURES;

EDDY CURRENT TESTING; EDDY CURRENTS; FEATURE EXTRACTION; FREQUENCY DOMAIN ANALYSIS; MANGANESE; SOLIDS; SPECTROSCOPY; SPECTRUM ANALYSIS; TIME DOMAIN ANALYSIS;

SURFACE DEFECTS;

EID: 82155181648     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2011.2160726     Document Type: Article

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