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Volumn 20, Issue 4, 2009, Pages 230-245

Independent component analysis-based feature extraction technique for defect classification applied for pulsed eddy current NDE

Author keywords

Defect classification; Independent component analysis (ICA); Lift off effect; Pulsed eddy current (PEC)

Indexed keywords

DEFECT CLASSIFICATION; EXPERIMENTAL DATA; FACIAL IMAGES; FEATURE ANALYSIS; FEATURE EXTRACTION TECHNIQUES; FEATURE SUBSPACE; HIGH ORDER STATISTICS; IMPROVED ICA; INDEPENDENT COMPONENTS; LIFT-OFF EFFECT; METAL LOSS; NONDESTRUCTIVE DETECTION; PULSED EDDY CURRENT; RESPONSE SIGNAL; SIGNAL REPRESENTATION MODEL; SINGLE DEFECT; SUBSURFACE DEFECT; TESTING TECHNIQUE;

EID: 70449713541     PISSN: 09349847     EISSN: 14322110     Source Type: Journal    
DOI: 10.1080/09349840903078996     Document Type: Article
Times cited : (34)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.