In situ atomic force microscopy observation of hydrogen absorption/desorption by Palladium thin film

Applied Surface Science

Volumn 258, Issue 4, 2011, Pages 1456-1459

  Matsumoto, Itoko ^a   Sakaki, Kouji ^a   Nakamura, Yumiko ^a   Akiba, Etsuo ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Atomic force microscopy; Film morphology; Hydrogen storage materials; In situ observation; Palladium film; Pd H system

Indexed keywords

AGGLOMERATION; ATOMIC FORCE MICROSCOPY; COMPRESSIVE STRESS; DESORPTION; HYDROGEN STORAGE; PALLADIUM; PALLADIUM COMPOUNDS; RESIDUAL STRESSES; X RAY DIFFRACTION;

COMPRESSIVE RESIDUAL STRESS; FILM MORPHOLOGY; H SYSTEMS; IN-SITU OBSERVATIONS; PALLADIUM FILMS; RESIDUAL TENSILE STRESS; SITU ATOMIC FORCE MICROSCOPY; TENSILE RESIDUAL STRESS;

THIN FILMS;

EID: 81555214105     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2011.09.103     Document Type: Article

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