Investigation of influence of gas atmosphere and pressure upon non-contact atomic force microscopy

Ultramicroscopy

Volumn 99, Issue 4, 2004, Pages 221-226

  Suzuki, Yasumasa ^a,b   Enoki, Hirotoshi ^a   Akiba, Etsuo ^a,b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b UTSUNOMIYA UNIVERSITY   (Japan)

Author keywords

07. 79. Lh; Gas atmosphere; Non contact AFM; Pressure

Indexed keywords

ARGON; DENSITY OF GASES; FREQUENCIES; HELIUM; HYDROGEN; NITROGEN; PRESSURE EFFECTS; RESONANCE;

GAS ATMOSPHERE; RESONANCE FREQUENCY; RESONANCE MEASUREMENTS;

ATOMIC FORCE MICROSCOPY;

ARGON; HELIUM; HYDROGEN; NITROGEN;

ARTICLE; ATMOSPHERIC PRESSURE; ATOMIC FORCE MICROSCOPY; DENSITY; EXPERIMENTAL DESIGN; FREQUENCY ANALYSIS; GAS ANALYSIS;

EID: 2442688155     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2003.12.008     Document Type: Article

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