Hydrogenography of PdHx thin films: Influence of H-induced stress relaxation processes

Acta Materialia

Volumn 57, Issue 4, 2009, Pages 1209-1219

  Gremaud, R ^a,b   Gonzalez Silveira, M ^a   Pivak, Y ^a   de Man, S ^a   Slaman, M ^a   Schreuders, H ^a   Dam, B ^a   Griessen, R ^a  

^a VU UNIVERSITY AMSTERDAM   (Netherlands)

^b SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

Author keywords

Hydride; Hydrogen storage; Hydrogenography; Optical transmission; Residual stress

Indexed keywords

ATMOSPHERIC TEMPERATURE; HYDROGEN; HYDROGEN STORAGE; LIGHT TRANSMISSION; RESIDUAL STRESSES; STRENGTH OF MATERIALS; THIN FILMS; TWO DIMENSIONAL;

COMBINATORIAL METHODS; CRACK NETWORKS; HYDRIDE; HYDROGENOGRAPHY; IN-PLANE STRESS; INDUCED STRESS; METAL-HYDROGEN SYSTEMS; OPTICAL THIN FILMS; OPTICAL TRANSMISSION; POLY-CRYSTALLINE; RESIDUAL STRESS;

OPTICAL FILMS;

EID: 59349099106     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2008.11.016     Document Type: Article

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