A structural study of Cu-In-Se compounds by x-ray absorption fine structure

Journal of Materials Research

Volumn 26, Issue 12, 2011, Pages 1504-1516

  Yamazoe, Seiji ^a   Kou, Hou ^a   Wada, Takahiro ^a  

^a RYUKOKU UNIVERSITY   (Japan)

Author keywords

Crystallographic structure; Extended x ray absorption fine structure (EXAFS); Photovoltaic

Indexed keywords

CHALCOPYRITE STRUCTURES; CRYSTALLOGRAPHIC STRUCTURE; CU K-EDGE; EXTENDED X-RAY ABSORPTION FINE STRUCTURES; LOCAL STRUCTURE; PHOTOVOLTAIC; PSEUDOBINARY COMPOUNDS; STRUCTURAL STUDIES; X RAY ABSORPTION FINE STRUCTURES; X-RAY ABSORPTION NEAR-EDGE STRUCTURE; XAFS; XANES;

COPPER COMPOUNDS; CURVE FITTING; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY;

X RAY ABSORPTION;

EID: 81455135627     PISSN: 08842914     EISSN: 20445326     Source Type: Journal    
DOI: 10.1557/jmr.2011.63     Document Type: Article

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