A comparative study of Cu-Se and In-Se bond length distributions in CuInSe2 with related In-rich compounds

Thin Solid Films

Volumn 480-481, Issue , 2005, Pages 295-300

  Merino, J M ^a   Diaz Moreno S ^b   Subias G ^c   Leon M ^a  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b RUTHERFORD APPLETON LABORATORY   (United Kingdom)

^c UNIVERSITY OF ZARAGOZA   (Spain)

Author keywords

Chalcogens; Cu In Se system; Structural properties; X ray absorption

Indexed keywords

ABSORPTION SPECTROSCOPY; CHEMICAL BONDS; CRYSTAL ATOMIC STRUCTURE; IONIC CONDUCTION; LOW TEMPERATURE EFFECTS; SOLAR CELLS; SYNCHROTRON RADIATION; TERNARY SYSTEMS; X RAY ANALYSIS; X RAY DIFFRACTION;

CHALCOGENS; CU-IN-SE SYSTEM; STRUCTURAL PROPERTIES; X-RAY ABSORPTION;

THIN FILMS;

EID: 18544373568     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.11.004     Document Type: Conference Paper

References (22)

1. T. Negami Solid State Phenom. 67/68 1999 349
2. B. Esene, M. Wagner, D. Wolf, and G. Muller J. Cryst. Growth 189/199 1999 321
3. M. Contreras, B. Egaas, K. Ramanathan, J. Hiltner, A. Swartzlander, F. Hasoon, and R. Noufi Prog. Photovolt. 7 1999 311
4. D. Schmid, M. Ruckh, F. Grunwald, and H.W. Schock J. Appl. Phys. 73 1993 2902
5. D. Schmid, M. Ruckh, and H.W. Schock Sol. Energy Mater. Sol. Cells 41/42 1996 281
6. S.D. Tsang, S.-H. Wei, A. Zunger, and H. Katayama-Yoshida Phys. Rev., B 57 1998 9642
7. S.-H. Wei, S.D. Tsang, and A. Zunger Appl. Phys. Lett. 72 1998 3199
8. N.M. Gasanly, A. Serpengurel, A. Audinly, O. Gurly, and I. Vilmax J. Appl. Phys. 85 1999 3198
9. I.V. Bodnar, V.F. Gremenok, V.Y. Rud, and Y.V. Rud Semiconductors 33 1999 740
10. G. Martin, R. Marques, S.M. Wasim, and R. Guevara Jpn. J. Appl. Phys., Suppl. 39-1 2000 44
11. B.H. Tseng, and C.A. Pert J. Appl. Phys. 65 1989 2254
12. H.Z. Xiao, L.-C. Yang, and A. Rockett J. Appl. Phys. 76 1994 1503
13. T. Hanada, A. Yamana, Y. Nakamura, O. Nittono, and T. Wada Jpn. J. Appl. Phys. 36 1997 L1494
14. W. Hönle, G. Kühn, and U.-C. Boehnke Cryst. Res. Technol. 23 1988 1347
15. J.M. Merino, S. Mahanty, M. León, R. Díaz, F. Rueda, and J.L. Martín de Vidales Thin Solid Films 361/362 2000 70
16. C.-H. Chang, S.-H. Wei, J.W. Jonson, S.B. Zang, N. Leyarovska, G. Bunker, and T.J. Anderson Phys. Rev., B 68 2003 54108
17. R. Lewandowska, R. Bacewicz, and J. Filipowicz Cryst. Res. Technol. 37 2002 235
18. J.M. Merino, J.L. Martín de Vidales, S. Mahanty, R. Díaz, F. Rueda, and M. León J. Appl. Phys. 80 1996 5610
19. J.L. Martín de Vidales, H. Charbonnier, R. Díaz, J.M. Merino, F. Rueda, and M. León Jpn. J. Appl. Phys., Suppl. 39-1 2000 336
20. M. Newville J. Synchrotron Radiat. 8 2001 322
21. H. Neumann Helv. Phys. Acta 58 1985 337
22. J.M. Merino, R. Díaz, and M. León Phys. Rev., B 61 2000 10211