Optical characteristics of amorphous V2O5 thin films colored by an excimer laser

Current Applied Physics

Volumn 12, Issue 2, 2012, Pages 489-493

  Kang, Manil ^a   Oh, Eunji ^a   Kim, Inkoo ^a   Kim, Sok Won ^a   Ryu, Ji Wook ^b   Kim, Yong Gi ^b  

^a University of Ulsan   (South Korea)

^b Kongju National University   (South Korea)

Author keywords

Coloration; Photoluminescence; Spectroscopic ellipsometry; V2O5

Indexed keywords

AS-GROWN; BAND TRANSITIONS; COLORATION; COMPLEX REFRACTIVE INDEX; CRYSTALLINE STRUCTURE; CRYSTALLINITIES; OPTICAL CHARACTERISTICS; OXYGEN DEFICIENCY; RAMAN STUDIES; RF SPUTTERING METHOD; UV-EXCIMER LASERS;

AMORPHOUS FILMS; EXCIMER LASERS; IRRADIATION; OXYGEN; OXYGEN VACANCIES; PHOTOLUMINESCENCE; REFRACTIVE INDEX; SPECTROSCOPIC ELLIPSOMETRY; SURFACE STRUCTURE; X RAY DIFFRACTION;

OPTICAL FILMS;

EID: 81155149976     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2011.08.007     Document Type: Article

References (30)

1. M. Benmoussa, A. Outzourhit, A. Bennouna, and E.L. Ameziane Thin Solid Films 405 2002 11
2. F. Beteille, and J. Livage J. Sol-Gel Sci. Techn 13 1998 915
3. Y. Wang, and G. Cao Chem. Mater. 18 2006 2787
4. J.H. Park, L.H. Tjeng, A. Tanaka, J.W. Allen, C.T. Chen, P. Metcalf, J.M. Honig, F.M.F. de Groot, and G.A. Sawatzky Phys. Rev. B 61 2000 11506
5. B. Sass, C. Tusche, W. Felsch, N. Quaas, A. Weismann, and M. Wenderoth J. Phys. Condens. Matter 16 2004 77
6. Y. Fujita, K. Miyazaki, and C. Tatsuyama Jpn. J. Appl. Phys. 24 1985 1082
7. K. Nagase, Y. Shimizu, N. Miura, and N. Yamazoe Appl. Phys. Lett. 61 1992 243
8. S.H. Lee, P. Liu, C.E. Tracy, and D.K. Benson Electrochem. Solid-State Lett. 2 1999 425
9. R. Lindstrom, V. Maurice, H. Groult, L. Perrigaud, S. Zanna, C. Cohen, and P. Marcus Electrochim. Acta 51 2006 5001
10. G.A. Rozgonyi, and W.J. Polito J. Electrochem. Soc. 115 1968 56
11. H.T. Kim, B.G. Chae, D.H. Youn, S.L. Maeng, G. Kim, K.Y. Kang, and Y.S. Lim New J. Phys. 6 2004 52
12. F.J. Morin Phys. Rev. Lett. 3 1959 34
13. E. Arcangeletti, L. Baldassarre, D. Di Castro, S. Lupi, L. Malavasi, C. Marini, A. Perucchi, and P. Postorino Phys. Rev. Lett. 98 2007 196406
14. C. Marini, E. Arcangeletti, D. Di Castro, L. Baldassare, A. Perucchi, S. Lupi, L. Malavasi, L. Boeri, E. Pomjakushina, K. Conder, and P. Postorino Phys. Rev. B 77 2008 235111
15. L.R. Smith, G.S. Rohrer, K.S. Lee, D.K. Seo, and M.H. Whangboo Surf. Sci. 367 1996 87
16. J.G. Zhang, J.M. McGraw, J. Turner, and D. Ginley J. Electrochem. Soc. 145 1997 1630
17. M. Nagashima, and H. Wada Thin Solid Films 312 1998 61
18. Z. Liu, G. Fang, Y. Wang, Y. Bai, and K.L. Yao J. Phys. D: Appl. Phys. 33 2000 2327
19. H. Fujiwara Spectroscopic Ellipsometry: Principles and Applications 2000 Wiley New York
20. D.A.G. Bruggemann Ann. Phys. 24 1935 636
21. M. Losurdo, and G. Bruno Appl. Phys. Lett. 77 2000 1129
22. S. Nishio, M. Kakihana, H. Eba, and K. Sakurai Jpn. J. Appl. Phys. 42 2003 5670
23. S. Krishnakuma, and C.S. Menon Phys. Stat. Sol. A 153 1996 439
24. N. Fateh, G.A. Fontalvo, and C. Mitterer J. Phys. D: Appl. Phys. 40 2007 7716
25. L.J. Meng, R.A. Silva, H.N. Cui, V. Teixeira, M.P. Dos Santos, and Z. Xu Thin Solid Films 515 2006 195
26. A.Z. Moshfegh, and A. Ignatiev Thin Solid Films 198 1991 251
27. Z.J. Zhang, Y. Zhao, and M.M. Zhu Appl. Phys. Lett. 88 2006 033101
28. X. Su, Z.J. Zhang, and M.M. Zhu Appl. Phys. Lett. 88 2006 061913
29. M.M. Zhu, Z.J. Zhang, and W. Miao Appl. Phys. Lett. 89 2006 021915
30. Y. Zhao, Z.C. Feng, Y. Liang, and H.W. Sheng Appl. Phys. Lett. 71 1997 2227