Li-intercalation behaviour of vanadium oxide thin film prepared by thermal oxidation of vanadium metal

Electrochimica Acta

Volumn 51, Issue 23, 2006, Pages 5001-5011

  Lindström, Rakel ^a   Maurice, Vincent ^a   Groult, Henri ^a   Perrigaud, Laurent ^a   Zanna, Sandrine ^a   Cohen, Camille ^b   Marcus, Philippe ^a  

^a CNRS   (France)

^b INSTITUT DES NANOSCIENCES DE PARIS   (France)

Author keywords

AFM; CV; EIS; Lithium intercalation; RBS; Thermal oxidation; Thin films; V2O5; V6O13; Vanadium oxides; XPS

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLIZATION; CYCLIC VOLTAMMETRY; DIFFUSION; LITHIUM; OXIDATION; PRESSURE EFFECTS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; VANADIUM COMPOUNDS; X RAY DIFFRACTION;

CHRONOPOTENTIOMETRY; LITHIUM INTERCALATION; THERMAL OXIDATION; VANADIUM OXIDES;

THIN FILMS;

EID: 33747226716     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2006.01.049     Document Type: Article

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