![]() |
Volumn 22, Issue 46, 2011, Pages
|
Metal-supported high crystalline Bi2Se3 quintuple layers
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ATOMIC STOICHIOMETRY;
AU(1 1 1 );
METAL SUBSTRATE;
X RAY PHOTOEMISSION SPECTROSCOPY;
X-RAY DIFFRACTION MEASUREMENTS;
ATOMIC SPECTROSCOPY;
EMISSION SPECTROSCOPY;
GOLD;
LATTICE MISMATCH;
MOLECULAR BEAM EPITAXY;
MOLECULAR BEAMS;
SCANNING TUNNELING MICROSCOPY;
SEMICONDUCTING SELENIUM COMPOUNDS;
STOICHIOMETRY;
X RAY DIFFRACTION;
BISMUTH;
|
EID: 80155195382
PISSN: 09574484
EISSN: 13616528
Source Type: Journal
DOI: 10.1088/0957-4484/22/46/465602 Document Type: Article |
Times cited : (18)
|
References (25)
|