Scanning tunneling microscopy of defect states in the semiconductor Bi2Se3

Physical Review B - Condensed Matter and Materials Physics

Volumn 66, Issue 16, 2002, Pages 1613061-1613064

  Urazhdin, S ^a   Bilc, D ^a   Tessmer, S H ^a   Mahanti, S D ^a   Kyratsi, Theodora ^a   Kanatzidis, M G ^a  

^a MICHIGAN STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH; SELENIUM;

ARTICLE; ATOM; CALCULATION; ELECTRON; ENERGY; GEOMETRY; IMAGE ANALYSIS; MATHEMATICAL ANALYSIS; MODEL; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR; STRUCTURE ANALYSIS;

EID: 0037110101     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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