Imaging the effect of dielectric breakdown in a multilayered polymer film

Journal of Applied Polymer Science

Volumn 123, Issue 4, 2012, Pages 2548-2557

  Wolak, Mason A ^a   Wan, Alan S ^b   Shirk, James S ^a   MacKey, Matt ^c   Hiltner, Anne ^c   Baer, Eric ^c  

^a NAVAL RESEARCH LABORATORY   (United States)

^b EVANS ANALYTICAL GROUP   (United States)

^c CASE WESTERN RESERVE UNIVERSITY   (United States)

Author keywords

dielectric properties; focused ion beam (FIB); multilayer composite; poly(vinylidene fluorides); polycarbonates; scanning electron microscopy (SEM)

Indexed keywords

BREAKDOWN PROCESS; CROSS SECTION; DIELECTRIC STRENGTHS; ELECTRICAL BREAKDOWN; ELECTRODE CONFIGURATIONS; FOCUSED ION BEAM (FIB); FOCUSED ION BEAM MILLING; GAIN INSIGHT; HOMOGENEOUS FILMS; INTERFACE PROPERTY; LAYER INTERFACES; MULTI-LAYERED; MULTILAYER COMPOSITE; NEEDLE-PLANE; QUASI-3D; SCANNING ELECTRONS; STORAGE CAPABILITY; THIN LAYERS; VINYLIDENE FLUORIDE;

COPOLYMERIZATION; COPOLYMERS; DIELECTRIC PROPERTIES; ELECTRIC BREAKDOWN; FLUORINE COMPOUNDS; FOCUSED ION BEAMS; INTERFACES (MATERIALS); MULTILAYER FILMS; MULTILAYERS; POLYMER FILMS; SCANNING ELECTRON MICROSCOPY; THREE DIMENSIONAL;

DIELECTRIC MATERIALS;

EID: 80155139563     PISSN: 00218995     EISSN: 10974628     Source Type: Journal    
DOI: 10.1002/app.34269     Document Type: Article

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