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Journal of Physics D: Applied Physics

Volumn 34, Issue 24, 2001, Pages 3485-3491

The barrier effect in three-layer solid dielectrics in quasi-uniform electric field

(5) Agoris, D P a Vitellas, I b Gefle, O S c Lebedev, S M c Pokholkov, Yu P c

a UNIVERSITY OF PATRAS (Greece)

b Public Power Corporation (Greece)

c NATIONAL RESEARCH TOMSK POLYTECHNIC UNIVERSITY (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN; ELECTRIC FIELDS; ELECTRODES; HOT PRESSING; PERMITTIVITY; POLARIZATION;

SOLID DIELECTRICS;

DIELECTRIC MATERIALS;

EID: 0035930830 PISSN: 00223727 EISSN: None Source Type: Journal
DOI: 10.1088/0022-3727/34/24/310 Document Type: Article

Times cited : (40)

References (15)

1
- 0001167433
- (1930) Electrotechn. Z. , vol.33 , pp. 1161-1165
- Marx, E.¹

2
- 0002712153
- (1988) J. Electricity , vol.10 , pp. 65-67
- Gefle, O.S.¹ Lebedev, S.M.² Zatuli, A.I.³ Reimer, L.A.⁴

3
- 0002021666
- (1947) J. Electricity , vol.6 , pp. 61-64
- Voloschenko, N.F.¹

4
- 0001981480
- (1978) J. Electricity , vol.9 , pp. 42-48
- Kuchinski, G.S.¹ Lisakovski, G.G.² Perfiletov, A.N.³

5
- 0031558873
- (1997) J. Phys. D: Appl. Phys. , vol.30 , pp. 3267-3273
- Gefle, O.S.¹ Lebedev, S.M.² Uschakov, Ya.V.³

6
- 34547564663
- (1930) Phys. Rev , vol.35 , pp. 269-273
- Sawyer, C.B.¹ Tower, C.H.²

7
- 0002069125
- Copenhagen, 14-16 June, 1999
- (1999) Proc. 16th Nordic Insulation Symp. , pp. 305-311
- Gefle, O.S.¹ Lebedev, S.M.² Pokholkov, Yu.P.³ Chichikin, V.I.⁴

8
- 0033316390
- Austin, USA, 17-21 October, 1999
- (1999) Annual Report of CEIDP'99 , pp. 265-268
- Lebedev, S.M.¹ Gefle, O.S.² Pokholkov, Yu.P.³ Chichikin, V.I.⁴

9
- 0025926464
- (1991) J. Electricity , vol.1 , pp. 66-68
- Lebedev, S.M.¹ Gefle, O.S.² Leschenko, L.I.³ Lipov, G.V.⁴

10
- 0007716714
- (1993) J. Appl. Phys. , vol.74 , pp. 6317-6321
- Dias, C.J.¹ Das-Gupta, D.K.²

11
- 0030363515
- (1996) IEEE Trans. Dielectrics and Electrical Insulation , vol.3 , pp. 800-805
- Chan, H.L.¹ Chen, Y.W.² Choy, C.L.³

12
- 0035329330
- (2001) IEE Proc. Science, Measurements and Technology , vol.148 , pp. 125-128
- Gefle, O.S.¹ Lebedev, S.M.² Pokholkov, Yu.P.³ Agoris, D.P.⁴ Vitellas, I.⁵

13
- 33746114495
- (1990) J. Appl. Phys. , vol.68 , pp. 6463-6471
- Miller, S.L.¹ Nasby, R.D.² Schwank, J.R.³ Rodgers, M.S.⁴ Dressendorfer, P.V.⁵

14
- 0000912660
- (1997) J. Appl. Phys. , vol.81 , pp. 876-881
- Barrow, D.A.¹ Petroff, T.E.² Tandon, R.P.³ Sayer, M.⁴

15
- 0035926034
- (2001) J. Phys. D: Appl. Phys. , vol.34 , pp. 1271-1275
- Lebedev, S.M.¹ Agoris, D.P.² Vitellas, I.³ Pokholkov, Yu.P.⁴

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