Three-dimensional failure analysis of high power semiconductor laser diodes operated in vacuum

Journal of Applied Physics

Volumn 102, Issue 12, 2007, Pages

  Yeoh, Terence S ^a   Chaney, John A ^a   Leung, Martin S ^a   Ives, Neil A ^a   Feinberg, Z D ^a   Ho, James G ^b   Wen, Jianguo ^c  

^a AEROSPACE CORPORATION   (United States)

^b NORTHROP GRUMMAN CORPORATION   (United States)

^c University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY DISPERSIVE SPECTROSCOPY; FAILURE ANALYSIS; FOCUSED ION BEAMS; MASS SPECTROMETRY; TRANSMISSION ELECTRON MICROSCOPY; VACUUM;

DAMAGE STRUCTURES; FIB NANOTOMOGRAPHY MODELS; TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRY (TOF-SIMS);

SEMICONDUCTOR LASERS;

EID: 37549024553     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2821151     Document Type: Article

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