New epitaxial phase transition between DG and HEX in PS-b-Pl

Journal of the American Chemical Society

Volumn 131, Issue 1, 2009, Pages 46-47

  Park, Hae Woong ^a   Jung, Jueun ^a   Chang, Taihyun ^a   Matsunaga, Kazuyuki ^b   Jinnai, Hiroshi ^b  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

^b KYOTO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

3D IMAGING; DIBLOCK COPOLYMER; DOMAIN ORIENTATION; GRAZING INCIDENCE SMALL-ANGLE X-RAY SCATTERING; INTERNAL STRUCTURE; PACKED CYLINDERS; SI WAFER; TRANSITION PATHS; TRANSMISSION ELECTRON MICROTOMOGRAPHY;

BLOCK COPOLYMERS; GALERKIN METHODS; ORGANIC POLYMERS; PHASE TRANSITIONS; POLYSTYRENES; SILICON WAFERS; THIN FILM DEVICES; THIN FILMS; THREE DIMENSIONAL; TRANSMISSION ELECTRON MICROSCOPY; X RAY SCATTERING;

SEMICONDUCTING SILICON COMPOUNDS;

COPOLYMER;

ARTICLE; CHEMICAL STRUCTURE; FILM; IMAGING SYSTEM; MICELLE; NEUTRON SCATTERING; PHASE TRANSITION; STRUCTURE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; X RAY CRYSTALLOGRAPHY;

EID: 67749088368     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja808259m     Document Type: Article

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