Compositional analysis with atomic column spatial resolution by 5th-order aberration-corrected scanning transmission electron microscopy

Microscopy and Microanalysis

Volumn 17, Issue 4, 2011, Pages 578-581

  Hernández Maldonado, David ^a   Herrera, Miriam ^a   Alonso González, Pablo ^b   González, Yolanda ^b   González, Luisa ^b   Gazquez, Jaume ^c   Varela, María ^c   Pennycook, Stephen J ^c   Guerrero Lebrero, María De La Paz ^a   Pizarro, Joaquín ^a   Galindo, Pedro L ^a   Molina, Sergio I ^a  

^a UNIVERSITY OF CÁDIZ   (Spain)

^b INSTITUTO DE MICROELECTRÓNICA DE MADRID   (Spain)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

5th order aberration corrected electron microscopy; atomic column resolution; chemical mapping; HAADF STEM; Muraki's segregation model; quantification

Indexed keywords

EID: 80054883821     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927611000213     Document Type: Article

References (12)

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