Accurate surface potential determination in Schottky diodes by the use of a correlated current and capacitance voltage measurements. Application to n-InP

Journal of Semiconductors

Volumn 32, Issue 10, 2011, Pages

  Ahaitouf, Ali ^a   Ahaitouf, Abdelaziz ^a   Salvestrini, Jean Paul ^b   Srour, Hussein ^b  

^a SIDI MOHAMED BEN ABDELLAH UNIVERSITY   (Morocco)

^b SUPELEC   (France)

Author keywords

barrier height; capacitance voltage; current measurements; ideality factor; interface states; Schottky diode; surface potential

Indexed keywords

BARRIER HEIGHTS; CAPACITANCE VOLTAGE; CURRENT MEASUREMENTS; IDEALITY FACTOR; INTERFACE STATES; SCHOTTKY DIODES;

CAPACITANCE; DIODES; INDIUM PHOSPHIDE; SCHOTTKY BARRIER DIODES; SEMICONDUCTOR DIODES; SURFACE PROPERTIES; THERMIONIC EMISSION;

SURFACE POTENTIAL;

EID: 80054798922     PISSN: 16744926     EISSN: None     Source Type: Journal    
DOI: 10.1088/1674-4926/32/10/104002     Document Type: Article

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