Crystallization kinetics of amorphous Cr2AlC thin films

Surface and Coatings Technology

Volumn 206, Issue 4, 2011, Pages 599-603

  Abdulkadhim, Ahmed ^a   Baben, Moritz to ^a   Takahashi, Tetsuya ^a   Schnabel, Volker ^a   Hans, Marcus ^a   Polzer, Conrad ^b   Polcik, Peter ^b   Schneider, Jochen M ^a  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b PLANSEE COMPOSITE MATERIALS GMBH   (Germany)

Author keywords

Amorphous thin films; Crystallization; MAX phase; Transformation kinetics

Indexed keywords

AB INITIO CALCULATIONS; AMORPHOUS THIN FILMS; EXOTHERMAL REACTION; MAX PHASE; NACL SUBSTRATES; ROOM TEMPERATURE; TRANSFORMATION KINETICS; XRD;

ACTIVATION ENERGY; CALCULATIONS; DIFFERENTIAL SCANNING CALORIMETRY; DISSOLUTION; KINETICS; SODIUM CHLORIDE; THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

CRYSTALLIZATION KINETICS;

EID: 80054118055     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2011.06.003     Document Type: Article

References (48)

1. Barsoum M.W. Prog. Solid State Chem. 2000, 28:201.
2. Music D., Schneider J.M. JOM 2007, 59:60.
3. Eklund P., Beckers M., Jansson U., Högberg H., Hultman L. Thin Solid Films 2010, 518:1851.
4. Hettinger J.D., Lofland S.E., Finkel P., Meehan T., Palma J., Harrell K., Gupta S., Ganguly A., El-Raghy T., Barsoum M.W. Phys. Rev. B 2005, 72:115120.
5. Barsoum M.W., El- Raghy T. J. Am. Ceram. Soc. 1996, 79:1953.
6. Tzenov N.V., Barsoum M.W. J. Am. Ceram. Soc. 2000, 83:825.
7. El-Raghy T., Zavaliangos A., Barsoum M.W., Kalidindi S.R. J. Am. Ceram. Soc. 1997, 80:513.
8. Sun Z., Zhou Y., Li M. Acta Mater. 2001, 49:4347.
9. http://www.3one2.com/.
10. http://www.Kanthal.com/.
11. Zhou A., Wang C., Huang Y. Mater. Sci. Eng. A 2003, 352:333.
12. Khoptiar Y., Gotman I., Gutmanas E.Y. J. Am. Ceram. Soc. 2005, 88:28.
13. Zhou Y., Sun Y., Chen S., Zhang Y. Mater. Res. Innov. 1998, 2:142.
14. Hendaoui A., Vrel D., Amara A., Langlois P., Andasmas M., Guerioune M. J. Eur. Ceram. Soc. 2010, 30:1049.
15. Schneider J.M., Rhode S.R., Sproul W.D., Matthews A. J. Phys. D: Appl. Phys. 2000, 33:R173.
16. Walter C., Martinez C., El-Raghy T., Schneider J.M. Steel Res. Int. 2005, 76:225.
17. Walter C., Sigumonrong D.P., El-Raghy T., Schneider J.M. Thin Solid Films 2006, 515:389.
18. Emmerlich J., Högberg H., Sasvari S., Persson P.O.A., Hultman L., Palmquist J.P., Jansson U., Molina-Aldareguia J.M., Czigany Z. J. Appl. Phys. 2004, 96:4817.
19. Lin Z.J., Zhou M.J., Li M.S., Wang L.Y., Zhou Y.C. Scr. Mater. 2007, 56:1115.
20. Riley D.P., Kisi E.H., Hansen T.C., Hewat A.W. J. Am. Ceram. Soc. 2002, 85:2417.
21. Sigumonrong D.P., Zhang J., Zhou Y., Music D., Schneider J.M. J. Phys. D: Appl. Phys. 2009, 42:185408.
22. Wilhelmsson O., Eklund P., Högberg H., Hultman L., Jansson U. Acta Mater. 2008, 56:2563.
23. Schneider J.M., Sigumonrong D.P., Music D., Walter C., Emmerlich J., Iskandar R., Mayer J. Scr. Mater. 2007, 57:1137.
24. Rosén J., Ryves L., Persson P.O.Å., Bilek M.M.M. J. Appl. Phys. 2007, 101:101.
25. Fakih H., Jacques S., Berthet M.-P., Bosselet F., Dezellus O., Viala J.-C. Surf. Coat. Technol. 2006, 201:3748.
26. Li J.J., Hu L.F., Li F.Z., Li M.S., Zhou Y.C. Surf. Coat. Technol. 2010, 204:3838.
27. Wilhelmsson O., Palmquist J.P., Nyberg T., Jansson U. Appl. Phys. Lett. 2004, 85:1066.
28. Lin Z., Zhou Y., Li M., Wang J. Z. Metallkd. 2005, 96:291.
29. Li S.B., Yu W.B., Zhai H.X., Song J.M., Sloof W.G., van der Zwaag S. J. Euro. Cer. Soc. 2011, 31:217.
30. Kohn W., Sham L. J. Phys. Rev. 1965, 140:A1133.
31. Kresse G., Joubert D. Phys. Rev. B 1999, 59:1758.
32. Monkhorst H.J., Pack J.D. Phys. Rev. B 1976, 13:5188.
33. Blöchl P.E. Phys. Rev. B 1994, 50:17953.
34. Zunger A., Wie S.-H., Ferreira L.G., Bernard J.E. Phys. Rev. Lett. 1990, 65:353.
35. Cottrell A.H. Mater. Sci. Technol. 1995, 11:100.
36. Cowley J.M. J. Appl. Phys. 1950, 21:24.
37. Abrikosov I.A., Niklasson A.M.N., Simak S.I., Johansson B., Ruban A.V., Skriver H.L. Phys. Rev. Lett. 1996, 76:4203.
38. Abrikosov I.A., Simak S.I., Johansson B., Ruban A.V., Skriver H.L. Phys. Rev. B 1997, 56:9319.
39. Schneider J.M., Larsson K., Lu J., Olsson E., Hjörvarsson B. Appl. Phys. Lett. 2002, 80:1144.
40. JCPDS card No. 14-519. (1996).
41. Shtansky D.V., Kiryukhantsev-Korneev Ph.V., Sheveyko A.N., Mavrin B.N., Rojas C., Fernandez A., Levashov E.A. Surf. Coat. Technol. 2009, 203:3595.
42. JCPDS card No. 29-17. (1996).
43. Schneider J.M., Sun Z., Mertens R., Uestel F., Ahuja R. Solid State Commun. 2004, 130:445.
44. Kissinger H.E. Anal. Chem. 1957, 29:1702.
45. Mroczkowska M., Czeppe T., Nowinski J.L., Garbarczyk J.E., Wasiucionek M. Solid State Ionics 2008, 179:202.
46. Liu L., Wu Z.F., Zhang J. J. Alloys Compd. 2002, 339:90.
47. Jiang X., Zhang H., Wen Q., Zhong Z.-Y., Tang X. Vacuum 2005, 77:209.
48. Mertens R., Sun Z., Music D., Schneider J.M. Adv. Eng. Mater. 2004, 6:903.