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Volumn 80, Issue 7, 2002, Pages 1144-1146
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Role of hydrogen for the elastic properties of alumina thin films
a b b b b,c |
Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINA THIN FILMS;
AMORPHOUS ALUMINA;
ELASTIC MODULUS VALUES;
ELASTIC PROPERTIES;
ELECTRONIC STRUCTURE CALCULATIONS;
HYDROGEN CONCENTRATION;
HYDROGEN INCORPORATION;
NUCLEAR RESONANCE ANALYSIS;
REACTIVE MAGNETRON SPUTTERING;
RUTHERFORD BACK-SCATTERING SPECTROMETRY;
SELECTED AREA ELECTRON DIFFRACTION;
ALUMINA;
ELASTIC MODULI;
ELASTICITY;
ELECTRON DIFFRACTION;
ELECTRONIC STRUCTURE;
HYDROGEN;
NANOINDENTATION;
OPTICAL FILMS;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
THIN FILMS;
AMORPHOUS FILMS;
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EID: 79955987564
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1448389 Document Type: Article |
Times cited : (69)
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References (17)
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