Carriers-mediated ferromagnetic enhancement in Al-doped ZnMnO dilute magnetic semiconductors

Materials Characterization

Volumn 62, Issue 11, 2011, Pages 1102-1107

  Saleem, Murtaza ^a   Siddiqi, Saadat A ^a,d   Atiq, Shahid ^a   Anwar, M Sabieh ^b   Hussain, Irshad ^b   Alam, Shahzad ^c  

^a UNIVERSITY OF THE PUNJAB   (Pakistan)

^b LAHORE UNIVERSITY OF MANAGEMENT SCIENCES   (Pakistan)

^c Laboratories Complex   (Pakistan)

^d Process and Energy Systems Engineering Center PRESTIGE   (Pakistan)

Author keywords

Al doped ZnMnO; Diluted magnetic semiconductors; Electrical properties; Magnetic properties; Sol gel synthesis

Indexed keywords

AL-DOPED ZNMNO; AL-DOPING; AUTO COMBUSTION; DILUTE MAGNETIC SEMICONDUCTORS; DILUTED MAGNETIC SEMICONDUCTORS; ELECTRICAL CONDUCTIVITY; ELECTRICAL PROPERTY; ELECTRICAL RESISTIVITY MEASUREMENTS; ENERGY DISPERSIVE X-RAY; FERROMAGNETIC BEHAVIORS; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; FREE CARRIERS; FREE ELECTRON; GRAIN SIZE; NANOCRYSTALLINES; ROOM TEMPERATURE; SCHERRER FORMULA; SECONDARY PHASIS; SOL-GEL SYNTHESIS; TEMPERATURE DEPENDENT; VIBRATING SAMPLE MAGNETOMETER; WURTZITE STRUCTURE; ZNO; ZNO STRUCTURES;

CARRIER CONCENTRATION; ELECTRIC CONDUCTIVITY; FERROMAGNETIC MATERIALS; FERROMAGNETISM; FIELD EMISSION MICROSCOPES; GELS; MAGNETIC PROPERTIES; MAGNETIC SEMICONDUCTORS; MANGANESE; SATURATION MAGNETIZATION; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING ANTIMONY; SEMICONDUCTOR DOPING; SOL-GEL PROCESS; SOL-GELS; SOLS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZINC COMPOUNDS; ZINC OXIDE; ZINC SULFIDE;

ALUMINUM;

EID: 80053971782     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchar.2011.08.003     Document Type: Article

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