메뉴 건너뛰기




Volumn 59, Issue 20, 2011, Pages 7508-7520

Application of synchrotron X-ray diffraction and nanoindentation for the determination of residual stress fields around scratches

Author keywords

Aluminium alloys; Nanoindentation; Residual stresses; Synchrotron radiation; X ray diffraction

Indexed keywords

DUCTILE MATERIALS; ENGINEERING MATERIALS; FATIGUE CYCLING; GOOD CORRELATIONS; INDENTATION METHOD; METALLIC MATERIAL; PEAK STRESS; RESIDUAL STRESS FIELDS; SMALL SCALE; SPATIAL SCALE; SYNCHROTRON X RAY DIFFRACTION; SYNCHROTRON X-RAY MEASUREMENT; TENSILE RESIDUAL STRESS;

EID: 80053957252     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2011.08.034     Document Type: Article
Times cited : (40)

References (29)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.