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Volumn 59, Issue 20, 2011, Pages 7508-7520
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Application of synchrotron X-ray diffraction and nanoindentation for the determination of residual stress fields around scratches
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Author keywords
Aluminium alloys; Nanoindentation; Residual stresses; Synchrotron radiation; X ray diffraction
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Indexed keywords
DUCTILE MATERIALS;
ENGINEERING MATERIALS;
FATIGUE CYCLING;
GOOD CORRELATIONS;
INDENTATION METHOD;
METALLIC MATERIAL;
PEAK STRESS;
RESIDUAL STRESS FIELDS;
SMALL SCALE;
SPATIAL SCALE;
SYNCHROTRON X RAY DIFFRACTION;
SYNCHROTRON X-RAY MEASUREMENT;
TENSILE RESIDUAL STRESS;
ALUMINUM;
ALUMINUM ALLOYS;
DIFFRACTION;
FATIGUE OF MATERIALS;
PLASTIC DEFORMATION;
RESIDUAL STRESSES;
STRAIN HARDENING;
SYNCHROTRON RADIATION;
SYNCHROTRONS;
X RAY DIFFRACTION;
NANOINDENTATION;
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EID: 80053957252
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/j.actamat.2011.08.034 Document Type: Article |
Times cited : (40)
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References (29)
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