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Volumn 49, Issue 5, 2003, Pages 459-465

Measurement of residual-stress effect by nanoindentation on elastically strained (1 0 0) W

Author keywords

Nanoindentation; Residual stresses; Stress interaction; Tungsten single crystal

Indexed keywords

INDENTATION; PLASTIC DEFORMATION; RESIDUAL STRESSES; STRESS RELAXATION; TUNGSTEN;

EID: 0037670195     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6462(03)00290-2     Document Type: Article
Times cited : (156)

References (16)
  • 10
    • 0038283336 scopus 로고    scopus 로고
    • R. Vinci, O. Kraft, N. Moody, & E. Shaffer. Pennsylvania, USA: Materials Research Society
    • Taljat B., Pharr G.M. Vinci R., Kraft O., Moody N., Shaffer E. Thin Films: Stresses and Mechanical Properties VIII. 2000;519-524 Materials Research Society, Pennsylvania, USA.
    • (2000) Thin Films: Stresses and Mechanical Properties VIII , pp. 519-524
    • Taljat, B.1    Pharr, G.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.