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Volumn 59, Issue 7, 2011, Pages 2749-2761

Use of nanoindentation to measure residual stresses in surface layers

Author keywords

Finite element analysis; Nanoindentation; Non destructive testing; Residual stresses

Indexed keywords

ABSOLUTE VALUES; APPLIED LOADS; BIAXIAL RESIDUAL STRESS; DIFFERENTIAL THERMAL CONTRACTION; DISPLACEMENT CONTROL; FINITE ELEMENT ANALYSIS; FINITE-ELEMENT MODELS; IN-PLANE; LOAD DISPLACEMENTS; NON-DESTRUCTIVE TESTING; SURFACE LAYERS; THIN COPPER FOILS; TIME CHARACTERISTICS;

EID: 79952360892     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2011.01.014     Document Type: Article
Times cited : (60)

References (12)
  • 3
    • 0033650363 scopus 로고    scopus 로고
    • Thin films: Stresses and mechanical properties VIII
    • Vinci R, Kraft O, Moody NR, Shaffer E, editors
    • Taljat B, Pharr GM. In: Vinci R, Kraft O, Moody NR, Shaffer E, editors. Thin films: stresses and mechanical properties VIII. Mater Res Soc; 2000. p. 519-24.
    • (2000) Mater Res Soc , pp. 519-524
    • Taljat, B.1    Pharr, G.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.