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Volumn 37, Issue 5, 2011, Pages 649-678

An analysis and survey of the development of mutation testing

Author keywords

Mutation testing; survey

Indexed keywords

COMPREHENSIVE ANALYSIS; DEVELOPMENT TRENDS; EMPIRICAL RESULTS; FAULT-BASED; MUTATION TESTING; SOFTWARE TESTING TECHNIQUES;

EID: 80053606092     PISSN: 00985589     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSE.2010.62     Document Type: Review
Times cited : (1381)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.