An approach to test data generation for killing multiple mutants

IEEE International Conference on Software Maintenance, ICSM

Volumn , Issue , 2006, Pages 113-122

  Liu, Ming Hao ^a   Gao, You Feng ^a   Shan, Jin Hui ^a   Liu, Jiang Hong ^a   Zhang, Lu ^a   Sun, Jia Su ^a  

^a PEKING UNIVERSITY   (China)

Author keywords

Adequacy criterion; Mutation testing; Test data generation; Unit testing

Indexed keywords

COMPUTER AIDED SOFTWARE ENGINEERING; COMPUTER PROGRAMMING; COST EFFECTIVENESS; SOFTWARE PROTOTYPING;

ADEQUACY CRITERION; MUTATION TESTING; SOFTWARE QUALITY; TEST DATA GENERATION; UNIT TESTING;

DATA PROCESSING;

EID: 34547261949     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSM.2006.13     Document Type: Conference Paper

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