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Volumn , Issue , 2000, Pages 217-
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Mutation testing applied to Estelle specifications
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER ARCHITECTURE;
COST EFFECTIVENESS;
DESIGN FOR TESTABILITY;
ERROR CORRECTION;
NETWORK PROTOCOLS;
ALTERNATING BIT PROTOCOL;
ESTELLE SPECIFICATIONS;
MUTATION TESTING;
PROGRAM TESTING;
PROGRAM DEBUGGING;
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EID: 0033870981
PISSN: 10603425
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (7)
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References (0)
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