An analysis of the coupling effect I: Single test data

Science of Computer Programming

Volumn 48, Issue 2-3, 2003, Pages 119-161

  How Tai Wah, K S ^a  

^a LONDON SOUTH BANK UNIVERSITY   (United Kingdom)

Author keywords

Coupling effect; Expected number of survivors; Fault size; Function degeneracy; Proper test set; Single fault (multi fault) alternate; Survival ratio

Indexed keywords

FUNCTIONS; PROBLEM SOLVING; SOFTWARE ENGINEERING;

COUPLING EFFECT;

DATA REDUCTION;

EID: 0042328321     PISSN: 01676423     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-6423(03)00022-4     Document Type: Article

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