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Volumn , Issue , 2007, Pages 151-160

New mutations for evaluation of specification and implementation levels of adequacy in testing of statecharts models

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FAULT CURRENTS; EMBEDDED SYSTEMS; INDUSTRIAL RESEARCH; INFORMATION THEORY; INTEGRATED CIRCUITS; SEMANTICS; TESTING;

EID: 48049108257     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TAICPART.2007.4344119     Document Type: Conference Paper
Times cited : (20)

References (21)
  • 2
    • 48049098312 scopus 로고
    • BetterState Product Review
    • December
    • "BetterState Product Review", IEEE Computer, December 1995
    • (1995) IEEE Computer
  • 3
    • 84957641717 scopus 로고    scopus 로고
    • Automated Test Set Generation for Statecharts
    • Hutter D, Stephan W, Traverso P, Ullmann M eds, Applied Formal Methods -FM-Trends 98, Springer Verlag
    • K.Bogdanov, M.Holcombe, H.Singh, "Automated Test Set Generation for Statecharts", In Hutter D, Stephan W, Traverso P, Ullmann M (eds), Applied Formal Methods -FM-Trends 98, LNCS 1641, Springer Verlag, 1999, pp. 107-121.
    • (1999) LNCS , vol.1641 , pp. 107-121
    • Bogdanov, K.1    Holcombe, M.2    Singh, H.3
  • 5
    • 84958985713 scopus 로고    scopus 로고
    • Statecharts in Use: Structured Analysis and Object-Orientation
    • Vaandrager F, Rozenberg G (eds) Lectures on Embedded Systems, Springer-Verlag
    • B. P. Douglass, D.Harel, M.Trakhtenbrot, "Statecharts in Use: Structured Analysis and Object-Orientation", In Vaandrager F, Rozenberg G (eds) Lectures on Embedded Systems, LNCS 1494, Springer-Verlag, 1998, pp. 368-394.
    • (1998) LNCS , vol.1494 , pp. 368-394
    • Douglass, B.P.1    Harel, D.2    Trakhtenbrot, M.3
  • 10
    • 0023365727 scopus 로고
    • Statecharts: A Visual Formalism for Complex Systems
    • D.Harel, "Statecharts: A Visual Formalism for Complex Systems", Science of Computer Programming, vol.8, 1987, pp.231-274.
    • (1987) Science of Computer Programming , vol.8 , pp. 231-274
    • Harel, D.1
  • 14
    • 4544370488 scopus 로고    scopus 로고
    • Automatic Test Generation from Statecharts Using Model Checking
    • Technical Report MS-CIS-01-07, Department of Computer and Information Science, University of Pennsylvania
    • H.S. Hong, I.Lee, O.Sokolsky, S.D. Cha, "Automatic Test Generation from Statecharts Using Model Checking", Technical Report MS-CIS-01-07, Department of Computer and Information Science, University of Pennsylvania, 2001.
    • (2001)
    • Hong, H.S.1    Lee, I.2    Sokolsky, O.3    Cha, S.D.4
  • 15
    • 0442311983 scopus 로고    scopus 로고
    • S. do R. S. de Souza, J.C.Maldonado, S.C.P.F. Fabbri, W.Lopes de Souza, Mutation testing applied to Estelle specifications, Software Quality Control, 8, Issue 4 (December 1999), pp. 285 - 301.
    • S. do R. S. de Souza, J.C.Maldonado, S.C.P.F. Fabbri, W.Lopes de Souza, "Mutation testing applied to Estelle specifications", Software Quality Control, Volume 8, Issue 4 (December 1999), pp. 285 - 301.
  • 16
    • 48049090148 scopus 로고    scopus 로고
    • S. do R. S. de Souza, J.C.Maldonado, S.C.P.F. Fabbri, P.C. Masiero, Statecharts specifications: a family of coverage testing criteria.
    • S. do R. S. de Souza, J.C.Maldonado, S.C.P.F. Fabbri, P.C. Masiero, "Statecharts specifications: a family of coverage testing criteria".
  • 18
    • 33646257763 scopus 로고    scopus 로고
    • Generating Test Sequences from Statecharts for Concurrent Program Testing
    • H.S. Seo, I.S.Chung and Y.R. Kwon, "Generating Test Sequences from Statecharts for Concurrent Program Testing", IEICE Transactions on Information and Systems, 2006 E89-D(4), pp. 1459-1469.
    • (2006) IEICE Transactions on Information and Systems , vol.E89-D , Issue.4 , pp. 1459-1469
    • Seo, H.S.1    Chung, I.S.2    Kwon, Y.R.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.