Structure of AuSi nanoparticles on Si(111) from reflection high-energy electron diffraction and scanning tunneling microscopy

European Physical Journal D

Volumn 63, Issue 2, 2011, Pages 225-230

  Bartling, S ^a   Barke, I ^a   Sell, K ^a   Polei, S ^a   Von Oeynhausen, V ^a   Meiwes Broer, K H ^a  

^a UNIVERSITY OF ROSTOCK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; CRYSTALS; GOLD COMPOUNDS; GOLD METALLOGRAPHY; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SILICON; SILICON COMPOUNDS;

CLOSED PACKED STRUCTURES; CRYSTAL ALIGNMENT; RANDOM ORIENTATIONS; SI (1 1 1); STM IMAGES; SUBSTRATE LATTICE;

REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;

EID: 80053575628     PISSN: 14346060     EISSN: 14346079     Source Type: Journal    
DOI: 10.1140/epjd/e2011-10604-8     Document Type: Article

References (31)

1. R. Wilkins, E. Ben-Jacob, R.C. Jaklevic, Phys. Rev. Lett. 63, 801 (1989)
2. D.L. Carroll, M. Wagner, M. Rühle, D.A. Bonnell, Phys. Rev. B 55, 9792 (1997)
3. K. Sell, I. Barke, S. Polei, C. Schumann, V. Von Oeynhausen, K.H. Meiwes-Broer, Phys. Stat. Sol. B 247, 1087 (2010)
4. W. Swiech, E. Bauer, M. Mundschau, Surf. Sci. 253, 283 (1991)
5. R. Plass, L.D. Marks, Surf. Sci. 380, 497 (1997)
6. S. Hasegawa, X. Tong, S. Takeda, N. Sato, T. Nagao, Progr. Surf. Sci. 60, 89 (1999)
7. I. Barke, F. Zheng, S. Bockenhauer, K. Sell, V. Von Oeynhausen, K.H. Meiwes-Broer, S.C. Erwin, F.J. Himpsel, Phys. Rev. B 79, 155301 (2009)
8. S.C. Erwin, I. Barke, F.J. Himpsel, Phys. Rev. B 80, 155409 (2009)
9. E.A. Khramtsova, H. Sakai, K. Hayashi, A. Ichimiya, Surf. Sci. 433-435, 405 (1999)
10. B. Predel, Landolt-Börnstein - Group IV Physical Chemistry (Springer, 1991)
11. M. Von Allmen, S.S. Lau, M. Mäenpää, B.Y. Tsaur, Appl. Phys. Lett. 36, 205 (1980)
12. F.H. Baumann, W. Schröter, Phys. Rev. B 43, 6510 (1991)
13. F.H. Baumann, W. Schröter, Philos. Mag. Lett. 57, 75 (1988)
14. A. Rota, A. Martinez-Gil, G. Agnus, E. Moyen, T. Maroutian, B. Bartenlian, R. Megy, M. Hanbucken, P. Beauvillain, Surf. Sci. 600, 1207 (2006)
15. E. Moyen et al., Appl. Phys. Lett. 94, 233101 (2009)
16. U.M. Bhatta, A. Rath, J.K. Dash, J. Ghatak, Y.F. Lai, C.P. Liu, P.V. Satyam, Nanotechnology 20, 465601 (2009)
17. M. Luo, W. Wen, C. Lin, C. Chiang, S. Sartale, M. Zei, Surf. Sci. 601, 2139 (2007)
18. D. Makarov, F. Liscio, C. Brombacher, J. Simon, G. Schatz, M. Maret, M. Albrecht, J. Magn. Magn. Mater. 320, 1858 (2008)
19. A. Wawro, M. Sobanska, A. Petroutchik, L.T. Baczewski, P. Pankowski, Nanotechnology 21, 335606 (2010)
20. A. Kleibert, A. Voitkans, K.H. Meiwes-Broer, Phys. Rev. B 81, 073412 (2010)
21. A. Kleibert, A. Voitkans, K.H. Meiwes-Broer, Phys. Stat. Sol. B 247, 1048 (2010)
22. J. Viernow, J.L. Lin, D.Y. Petrovykh, F.M. Leibsle, F.K. Men, F.J. Himpsel, Appl. Phys. Lett. 72, 948 (1998)
23. Y.N. Yang, E.S. Fu, E.D. Williams, Surf. Sci. 356, 101 (1996)
24. T. Ichikawa, S. Ino, Surf. Sci. 105, 395 (1981)
25. D. Rogers, T. Tiedje, Surf. Sci. 274, L599 (1992)
26. B.S. Swartzentruber, Y.W. Mo, M.B. Webb, M.G. Lagally, J. Vac. Sci. Technol. 7, 2901 (1989)
27. H. Hibino, Y. Watanabe, Surf. Sci. 588, L233 (2005)
28. P. Ichimiya, P.I. Cohen, Reflection High Energy Electron Diffraction (Cambridge University Press, 2004)
29. Y.S. Wang, J.M. Li, F.F. Zhang, L.Y. Lin, J. Cryst. Growth 201-202, 564 (1999)
30. B. Fultz, J.M. Howe, Transmission Electron Microscopy and Diffractometry of Materials (Springer, 2008)
31. O. Robách, G. Renaud, A. Barbier, Phys. Rev. B 60, 5858 (1999)