Single crystal strontium titanate surface and bulk modifications due to vacuum annealing

Journal of Applied Physics

Volumn 110, Issue 6, 2011, Pages

  Hanzig, Juliane ^a   Abendroth, Barbara ^a   Hanzig, Florian ^a   Stcker, Hartmut ^a   Strohmeyer, Ralph ^a   Meyer, Dirk C ^a   Lindner, Susi ^b   Grobosch, Mandy ^b   Knupfer, Martin ^b   Himcinschi, Cameliu ^a   Mhle, Uwe ^a   Munnik, Frans ^c  

^a TU BERGAKADEMIE FREIBERG   (Germany)

^b Leibniz Institut F ur Festkörper und WerkstoffforschungDresden   (Germany)

^c INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORBED MOLECULES; ANNEALING PROCESS; BULK MODIFICATION; BULK PROPERTIES; CHARACTERIZATION METHODS; EX SITU; LASER ANNEALING; LINE DEFECTS; N-TYPE CONDUCTIVITY; NEAR-SURFACE; OXYGEN ABSORPTION; REAL STRUCTURE; SRTIO; STRONTIUM TITANATE SURFACE; STRUCTURE MODIFICATION; SURFACE POINTS; VACUUM-ANNEALING;

ANNEALING; ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; CRYSTAL STRUCTURE; DIFFRACTIVE OPTICS; DISLOCATIONS (CRYSTALS); ELECTRIC CONDUCTIVITY; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; INFRARED SPECTROSCOPY; OXYGEN; OXYGEN VACANCIES; PHOTOLUMINESCENCE SPECTROSCOPY; POINT DEFECTS; SPECTROSCOPIC ELLIPSOMETRY; STRONTIUM; STRONTIUM ALLOYS; STRONTIUM TITANATES; SURFACE DEFECTS; TRANSMISSION ELECTRON MICROSCOPY; VACUUM; X RAY PHOTOELECTRON SPECTROSCOPY;

SINGLE CRYSTALS;

EID: 80053532045     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3638692     Document Type: Article

References (39)

1. R. Merkle and J. Maier, Angew. Chem. Int. Ed. 47, 3874 (2008). 10.1002/anie.200700987
2. R. de Souza, J. Fleig, R. Merkle, and J. Maier, Zeitschrift fr Metallkunde 94, 218 (2003).
3. J. Robertson, J. Vacuum Sci. Technol. B 18, 1785 (2000). 10.1116/1.591472
4. A. Sawa, Mater. Today 11, 28 (2008). 10.1016/S1369-7021(08)70119-6
5. K. Szot, W. Speier, G. Bihlmayer, and R. Waser, Nat. Mater. 5, 312 (2006). 10.1038/nmat1614
6. N. H. Chan, R. K. Sharma, and D. M. Smyth, J. Electrochem. Soc. 128, 1762 (1981). 10.1149/1.2127727
7. H. Stcker, M. Zschornak, J. Seibt, F. Hanzig, S. Wintz, B. Abendroth, J. Kortus, and D. C. Meyer, Appl. Phys. A, 100, 437-445 (2010) 10.1007/s00339-010- 5848-0.
8. R. Waser, J. Am. Ceram. Soc. 74, 1934 (1991). 10.1111/j.1151-2916.1991. tb07812.x
9. R. Moos and K. H. Hrdtl, J. Am. Ceram. Soc. 80, 2549 (1997). 10.1111/j.1151-2916.1997.tb03157.x
10. F. A. Krger and H. J. Vink, in Solid State Physics, edited by, F. Seitz, and, D. Turnbull, (Academic Press, New York, 1956), Vol. 3, pp. 307-435.
11. T. Baiatu, R. Waser, and K. H. Hrdtl, J. Am. Ceram. Soc. 73, 1663 (1990). 10.1111/j.1151-2916.1990.tb09811.x
12. K. Szot, W. Speier, R. Carius, U. Zastrow, and W. Beyer, Phys. Rev. Lett. 88, 75508 (2002). 10.1103/PhysRevLett.88.075508
13. L. Merker, Trans. Am. Inst. Min. Eng. 7, 645 (1955).
14. J. S. Waugh, A. E. Paladino, B. Di Benedetto, and R. Wantman, J. Am. Ceram. Soc. 46, 60 (1963). 10.1111/j.1151-2916.1963.tb13774.x
15. U. Kreissig, R. Grtzschel, and R. Behrisch, Nuclear Instruments and Methods in Physics Research Section B 85, 71 (1994). 10.1016/0168-583X(94)95789- 4
16. K. V. Benthem, C. Elssser, and R. H. French, J. Appl. Phys. 90, 6156 (2001). 10.1063/1.1415766
17. H. Fujiwara, Spectroscopic Ellipsometry: Principles and Applications (Wiley, Chichester, 2007).
18. T. Nestler, K. Potzger, H. Stcker, B. Abendroth, R. Strohmeyer, R. Zierer, and D. C. Meyer, Increased cubic-tetragonal phase transition temperature and resistivity hysteresis of surface vacuum annealed SrTiO3, Appl. Phys. A (published online).
19. T. Tanaka, K. Matsunaga, Y. Ikuhara, and T. Yamamoto, Phys. Rev. B 68, 205213 (2003). 10.1103/PhysRevB.68.205213
20. Q. Fu and T. Wagner, Surf. Sci. Rep. 62, 431 (2007). 10.1016/j.surfrep. 2007.07.001
21. F. Silly and M. R. Castell, Applied Physics Letters 85, 3223 (2004). 10.1063/1.1805177
22. S. Taeri, D. Brunner, W. Sigle, and M. M. Rhle, Zeitschrift fr Metallkunde 95, 433 (2004).
23. R. Waser, R. Dittmann, G. Staikov, and K. Szot, Adv. Mater. 21, 2632 (2009). 10.1002/adma.200900375
24. S. Ferrer and G. Somorjai, Surf. Sci. 94, 41 (1980). 10.1016/0039- 6028(80)90155-7
25. V. M. Longo, A. T. de Figueiredo, S. de Lazaro, M. Gurgel, M. G. S. Costa, C. O. PaivaSantos, J. A. Varela, E. Longo, V. R. Mastelaro, F. S. D. Vicente, and Andere, J. Appl. Phys. 104, 23515 (2008). 10.1063/1.2956741
26. T. Bieger, J. Maier, and R. Waser, Berichte der Bunsengesellschaft fr Physikalische Chemie 97, 1098 (1993).
27. J. G. Mavroides, J. A. Kafalas, and D. F. Kolesar, Appl. Phys. Lett. 28, 241 (1976). 10.1063/1.88723
28. J. M. Lehn, J. P. Sauvage, and R. Ziessel, Nouv. J. Chim. 4, 623 (1980).
29. V. Atuchin, V. Kesler, N. Pervukhina, and Z. Zhang, J. Electron Spectroscopy 152, 18 (2006). 10.1016/j.elspec.2006.02.004
30. P. Nagarkar, P. Searson, and F. Gealy, J. Appl. Phys. 69, 459 (1991). 10.1063/1.347685
31. T. Nishimura, A. Ikeda, H. Namba, T. Morishita, and Y. Kido, Surf. Sci. 421, 273 (1999). 10.1016/S0039-6028(98)00840-1
32. J. Moulder, Handbook of X-ray Photoelectron Spectroscopy (Perkin-Elmer Corporation, Physical Electronics Division, 1992).
33. Y. Chung and W. Weissbard, Phys. Rev. B 20, 3456 (1979). 10.1103/PhysRevB.20.3456
34. M. Grobosch, K. Drr, R. B. Gangineni, and M. Knupfer, Appl. Phys. Lett. 92, 023302 (2008). 10.1063/1.2829391
35. M. Grobosch, K. Drr, R. B. Gangineni, and M. Knupfer, Adv. Eng. Mater. 11, 285 (2009). 10.1002/adem.200800240
36. A. Zangwill, Physics at Surfaces (Cambridge University Press, Cambridge, 1988).
37. M. Grobosch, Ph.D. thesis (Technische Universitt Dresden, 2009).
38. J. Blanc and D. L. Staebler, Phys. Rev. B 4, 3548 (1971). 10.1103/PhysRevB.4.3548
39. J. D. Baniecki, M. Ishii, K. Kurihara, K. Yamanaka, T. Yano, K. Shinozaki, T. Imada, and Y. Kobayashi, J. Appl. Phys. 106, 054109 (2009). 10.1063/1.3169654