The microstructure of dislocation clusters in industrial directionally solidified multicrystalline silicon

Journal of Applied Physics

Volumn 110, Issue 6, 2011, Pages

  Kivambe, Maulid M ^a   Stokkan, Gaute ^a   Ervik, Torunn ^a   Ryningen, Birgit ^b   Lohne, Otto ^a  

^a NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

^b SINTEF MATERIALS AND CHEMISTRY   (Norway)

Author keywords

[No Author keywords available]

Indexed keywords

DIRECTIONALLY SOLIDIFIED; DISLOCATION ARRAYS; DISLOCATION CLUSTERS; DISLOCATION CONFIGURATIONS; DISLOCATION PATTERN; ELECTRON BACK SCATTER DIFFRACTION; GRAIN SURFACE; HIGH TEMPERATURE; LOW ENERGY CONFIGURATIONS; MULTI-CRYSTALLINE SILICON; ON-WAFER; RECOVERY PROCESS;

CRYSTAL GROWTH; GRAIN BOUNDARIES; MICROSTRUCTURE; POLYSILICON; SILICON WAFERS; TRANSMISSION ELECTRON MICROSCOPY;

DISLOCATIONS (CRYSTALS);

EID: 80053505789     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3641978     Document Type: Article

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